Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Mounir Fares"'
Autor:
Victoria Wang, Karthikeyan Rajagopal, S. Madhavapeddi, Siraj Akhtar, A. Jain, Charles Sestok, Hunsoo Choo, Vijayavardhan Baireddy, Scott Kaylor, Petteri Litmanen, Jaimin Mehta, Venkatesh Srinivasan, Satish V. Uppathil, A. Frank, A. Akour, Nikolaus Klemmer, Hamid Safiri, F. Dulger, Dhritiman Ghosh, S. Ramakrishnan, E. Zhang, Mounir Fares, V. Sinari, Himanshu Arora, C. Fernando
Publikováno v:
ISSCC
Increasing mobile data demands are pushing cellular network capacity. Massive MIMO base stations with large antenna arrays and smaller cell sizes demand higher integration in radio transceivers than what is available [1].
Publikováno v:
IEEE Journal of Solid-State Circuits. 46:2892-2903
A new digital signal processing approach to shaping intersymbol interference (ISI) and static mismatch errors simultaneously in oversampled multi-level digital to analog converters (DAC) has recently been proposed. In this paper, a mathematical frame
Autor:
Bozena Kaminska, Mounir Fares
Publikováno v:
Journal of Electronic Testing. 5:299-305
Test decisions still constitute one of the most difficult and time-consuming design tasks. This is particularly true in the analog domain where some basic test questions have not yet been completely resolved. Since the gap between a good and a bad an
Publikováno v:
ISSCC
The current trend in high-performance audio DACs is to use fine-resolution quantization to reduce the out-of-band noise (OBN), reduce jitter sensitivity, and simplify analog filtering. Recent techniques achieve this goal by using a mix of DAC element
Autor:
Mounir Fares, Halil Kiper, Gabriel Gomez, Lars Risbo, Baher S. Haroun, Gangadhar Burra, Rahmi Hezar
Publikováno v:
ISSCC
Mobile consumer audio applications are demanding higher performance, longer battery life and lower cost. Achieving low out-of-band noise (OBN) is one of the key elements in designing inexpensive, low-power and robust audio DACs. Lowering OBN reduces
Autor:
Mounir Fares, Bozena Kaminska
Publikováno v:
Economics of Electronic Design, Manufacture and Test ISBN: 9781441951427
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::570276d91f542c8293ecf562885e7fb0
https://doi.org/10.1007/978-1-4757-5048-5_16
https://doi.org/10.1007/978-1-4757-5048-5_16
Conference
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.