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pro vyhledávání: '"Mouhamad Diallo"'
Autor:
Nathan J. Szymanski, Christopher J. Bartel, Yan Zeng, Mouhamad Diallo, Haegyeom Kim, Gerbrand Ceder
Publikováno v:
npj Computational Materials, Vol 9, Iss 1, Pp 1-8 (2023)
Abstract Machine learning (ML) has become a valuable tool to assist and improve materials characterization, enabling automated interpretation of experimental results with techniques such as X-ray diffraction (XRD) and electron microscopy. Because ML
Externí odkaz:
https://doaj.org/article/f2723b88620a4b2f852a8f89285667fd
