Zobrazeno 1 - 10
of 121
pro vyhledávání: '"Mottaqiallah Taouil"'
Autor:
Abdullah Aljuffri, Ruoyu Huang, Laura Muntenaar, Georgi Gaydadjiev, Kezheng Ma, Said Hamdioui, Mottaqiallah Taouil
Publikováno v:
Cryptography, Vol 8, Iss 2, p 24 (2024)
The Advanced Encryption Standard (AES) is widely recognized as a robust cryptographic algorithm utilized to protect data integrity and confidentiality. When it comes to lightweight implementations of the algorithm, the literature mainly emphasizes ar
Externí odkaz:
https://doaj.org/article/d786ae6715d84ff0b95de1a462134114
Publikováno v:
IEEE Access, Vol 10, Pp 70187-70203 (2022)
Design-space exploration for low-power manycore design is a daunting and time-consuming task which requires some complex tools and frameworks to achieve. In the presence of process variation, the problem becomes even more challenging, especially the
Externí odkaz:
https://doaj.org/article/3bcd9f7adb854fe892dab5d02a6405b3
Publikováno v:
IEEE Access, Vol 7, Pp 33115-33129 (2019)
In this paper, we study the impact of the idle/dynamic power consumption ratio on the effectiveness of a multi-Vdd/frequency manycore design. We propose a new tool called LVSiM (a Low-Power and Variation-Aware Manycore Simulator) to carry out the exp
Externí odkaz:
https://doaj.org/article/e8838775bc0b4a1d8f668f417739c83e
Autor:
Troya Çağıl Köylü, Cezar Rodolfo Wedig Reinbrecht, Anteneh Gebregiorgis, Said Hamdioui, Mottaqiallah Taouil
Publikováno v:
ACM Journal on Emerging Technologies in Computing Systems. 19:1-37
Hardware security is currently a very influential domain, where each year countless works are published concerning attacks against hardware and countermeasures. A significant number of them use machine learning, which is proven to be very effective i
Autor:
Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:4991-5004
The popularity of perpendicular magnetic tunnel junction (pMTJ)-based spin-transfer torque magnetic random access memories (STT-MRAMs) is growing very fast. The performance of such memories is very sensitive to magnetic fields, including both interna
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 29(11)
Side-channel attacks (SCAs) are powerful attacks that could be used to retrieve keys from electronic devices. Several physical leakage sources can be exploited in SCAs, such as power, time, heat, and so on. Heat is one of the side-channels that is no
Considerable research effort has been put on securing Implantable Medical Devices (IMDs) over the last two decades. However, this has not been effectively translated into practice. We highlight the key problems the IMD industry needs to address in or
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::898654b8690031fd6e56fd15c9381512
https://doi.org/10.36227/techrxiv.21602451.v1
https://doi.org/10.36227/techrxiv.21602451.v1
Publikováno v:
2022 IEEE 31st Asian Test Symposium (ATS).
Fault injection attacks pose an important threat to security-sensitive applications, such as secure communication and storage. By injecting faults into instructions, an attacker can cause information leakage or denial-of-service. Hence, it is importa
Autor:
Anteneh Gebregiorgis, Hoang Anh Du Nguyen, Jintao Yu, Rajendra Bishnoi, Mottaqiallah Taouil, Francky Catthoor, Said Hamdioui
Faster and cheaper computers have been constantly demanding technological and architectural improvements. However, current technology is suffering from three technology walls: leakage wall, reliability wall, and cost wall. Meanwhile, existing archite
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0d6ea2609588ba99e966c72de735f2a1
https://lirias.kuleuven.be/handle/20.500.12942/710823
https://lirias.kuleuven.be/handle/20.500.12942/710823
Publikováno v:
2022 IEEE International Test Conference in Asia (ITC-Asia).
Testing of Computation-in-Memory (CIM) designs based on emerging non-volatile memory technologies, such as resistive RAM (RRAM), is fundamentally different from testing traditional memories. Such designs allow not only for data storage (i.e., memory