Releasable micro-waveplates

Autor: Grineviciute, L., Tolenis, T., Ryu, M., Moein, T., Ng, S. -H., Katkus, T., Maksimovic, Jovan, Drazdys, R., Morikawa, J., Juodkazis, S.

A simple procedure is demonstrated for fabrication of waveplates which can be released from substrate by laser cutting. Oblique angle deposition, chemical etching and laser inscription steps were used for the final lift-off and release of micro-wavep

Externí odkaz: http://arxiv.org/abs/1907.05485

Covalent Bonds versus van der Waals Forces: A Picture in Thermal Conduction of Organic Materials.

Autor: Takehara R; Laboratory for Chemistry and Life Science, Institute of Innovative Research, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501, Japan.; Department of Chemical Science and Engineering, School of Materials and Chemical Technology, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501, Japan.; Research Center for Autonomous Systems Materialogy (ASMat), Institute of Innovative Research, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501, Japan., Fukui T; Laboratory for Chemistry and Life Science, Institute of Innovative Research, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501, Japan.; Department of Chemical Science and Engineering, School of Materials and Chemical Technology, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501, Japan.; Research Center for Autonomous Systems Materialogy (ASMat), Institute of Innovative Research, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501, Japan., Tano T; Laboratory for Chemistry and Life Science, Institute of Innovative Research, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501, Japan.; Department of Chemical Science and Engineering, School of Materials and Chemical Technology, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501, Japan., Ryu M; National Methodology Institute of Japan (NMIJ), Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba 305-8563, Japan., Kitani S; Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8501, Japan., Kawaji H; Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8501, Japan., Morikawa J; Research Center for Autonomous Systems Materialogy (ASMat), Institute of Innovative Research, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501, Japan.; Department of Materials Science and Engineering, School of Materials and Chemical Technology, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo 152-8550, Japan., Fukushima T; Laboratory for Chemistry and Life Science, Institute of Innovative Research, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501, Japan.; Department of Chemical Science and Engineering, School of Materials and Chemical Technology, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501, Japan.; Research Center for Autonomous Systems Materialogy (ASMat), Institute of Innovative Research, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501, Japan.

Publikováno v: Journal of the American Chemical Society [J Am Chem Soc] 2024 Nov 06; Vol. 146 (44), pp. 30548-30552. Date of Electronic Publication: 2024 Oct 24.

Polarimeters for the Detection of Anisotropy from Reflectance.

Autor: Kamegaki S; School of Materials and Chemical Technology, Tokyo Institute of Technology, Ookayama, Meguro-ku, Tokyo 152-8550, Japan., Khajehsaeidimahabadi Z; Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia.; Aerostructures Innovation Research Hub (AIR Hub), Swinburne University of Technology, John St, Hawthorn, VIC 3122, Australia., Ryu M; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba 305-8563, Ibaraki, Japan., Le NHA; Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia., Ng SH; Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia., Buividas R; Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia., Seniutinas G; Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia., Anand V; Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia., Juodkazis S; Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia.; WRH Program International Research Frontiers Initiative (IRFI), Tokyo Institute of Technology, Nagatsuta-cho, Midori-ku, Yokohama 226-8503, Kanagawa, Japan.; Laser Research Center, Physics Faculty, Vilnius University, Saulėtekio Ave. 10, 10223 Vilnius, Lithuania., Morikawa J; School of Materials and Chemical Technology, Tokyo Institute of Technology, Ookayama, Meguro-ku, Tokyo 152-8550, Japan.; WRH Program International Research Frontiers Initiative (IRFI), Tokyo Institute of Technology, Nagatsuta-cho, Midori-ku, Yokohama 226-8503, Kanagawa, Japan.; Research Center for Autonomous Systems Materialogy (ASMat), Institute of Innovative Research, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8501, Kanagawa, Japan.

Publikováno v: Micromachines [Micromachines (Basel)] 2024 Jun 17; Vol. 15 (6). Date of Electronic Publication: 2024 Jun 17.

High-speed dynamics of temperature distribution in ultrafast (up to 10⁸ K/s) chip-nanocalorimeters, measured by infrared thermography of high resolution.

Autor: Minakov, A., Morikawa, J., Zhuravlev, E., Ryu, M., van Herwaarden, A. W., Schick, C.

Publikováno v: Journal of Applied Physics; 2019, Vol. 125 Issue 5, pN.PAG-N.PAG, 15p, 3 Charts, 18 Graphs

Roadmap on computational methods in optical imaging and holography [invited].

Autor: Rosen J; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel.; Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia., Alford S; Department of Anatomy and Cell Biology, University of Illinois at Chicago, 808 South Wood Street, Chicago, IL 60612 USA., Allan B; Faculty of Science Engineering and Built Environment, Deakin University, Princes Highway, Warrnambool, VIC 3280 Australia., Anand V; Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia.; Optical Sciences Center and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Computing and Engineering Technologies, Optical Sciences Center, Swinburne University of Technology, Hawthorn, Melbourne, VIC 3122 Australia., Arnon S; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel., Arockiaraj FG; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel.; Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia., Art J; Department of Anatomy and Cell Biology, University of Illinois at Chicago, 808 South Wood Street, Chicago, IL 60612 USA., Bai B; Electrical and Computer Engineering Department, Bioengineering Department, California NanoSystems Institute, University of California, Los Angeles (UCLA), Los Angeles, CA USA., Balasubramaniam GM; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel., Birnbaum T; Department of Electronics and Informatics (ETRO), Vrije Universiteit Brussel VUB), Pleinlaan 2, 1050 Brussel, Belgium.; Swave BV, Gaston Geenslaan 2, 3001 Leuven, Belgium., Bisht NS; Applied Optics and Spectroscopy Laboratory, Department of Physics, Soban Singh Jeena University Campus Almora, Almora, Uttarakhand 263601 India., Blinder D; Department of Electronics and Informatics (ETRO), Vrije Universiteit Brussel VUB), Pleinlaan 2, 1050 Brussel, Belgium.; IMEC, Kapeldreef 75, 3001 Leuven, Belgium.; Graduate School of Engineering, Chiba University, 1-33 Yayoi-cho, Inage-ku, Chiba, Chiba Japan., Cao L; Department of Precision Instruments, Tsinghua University, Beijing, 100084 China., Chen Q; Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense, Nanjing, 210094 Jiangsu China., Chen Z; Fujian Provincial Key Laboratory of Light Propagation and Transformation, College of Information Science and Engineering, Huaqiao University, Xiamen, 361021 Fujian China., Dubey V; Department of Physics and Technology, UiT The Arctic University of Norway, 9037 Tromsø, Norway., Egiazarian K; Computational Imaging Group, Faculty of Information Technology and Communication Sciences, Tampere University, 33100 Tampere, Finland., Ercan M; Institute of Materials Science and Nanotechnology, National Nanotechnology Research Center (UNAM), Bilkent University, 06800 Ankara, Turkey.; Department of Physics, Bilkent University, 06800 Ankara, Turkey., Forbes A; School of Physics, University of the Witwatersrand, Johannesburg, South Africa., Gopakumar G; Department of Computer Science and Engineering, Amrita School of Computing, Amrita Vishwa Vidyapeetham, Amritapuri, Vallikavu, Kerala India., Gao Y; Department of Precision Instruments, Tsinghua University, Beijing, 100084 China., Gigan S; Laboratoire Kastler Brossel, Centre National de la Recherche Scientifique (CNRS) UMR 8552, Sorbonne Universite ´, Ecole Normale Supe ´rieure-Paris Sciences et Lettres (PSL) Research University, Collège de France, 24 rue Lhomond, 75005 Paris, France., Gocłowski P; Department of Physics and Technology, UiT The Arctic University of Norway, 9037 Tromsø, Norway., Gopinath S; Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia., Greenbaum A; Department of Biomedical Engineering, North Carolina State University and University of North Carolina at Chapel Hill, Raleigh, NC 27695 USA.; Comparative Medicine Institute, North Carolina State University, Raleigh, NC 27695 USA.; Bioinformatics Research Center, North Carolina State University, Raleigh, NC 27695 USA., Horisaki R; Graduate School of Information Science and Technology, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo, 113-8656 Japan., Ierodiaconou D; Faculty of Science Engineering and Built Environment, Deakin University, Princes Highway, Warrnambool, VIC 3280 Australia., Juodkazis S; Optical Sciences Center and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Computing and Engineering Technologies, Optical Sciences Center, Swinburne University of Technology, Hawthorn, Melbourne, VIC 3122 Australia.; World Research Hub Initiative (WRHI), Tokyo Institute of Technology, 2-12-1, Ookayama, Tokyo, 152-8550 Japan., Karmakar T; Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh 221005 India., Katkovnik V; Computational Imaging Group, Faculty of Information Technology and Communication Sciences, Tampere University, 33100 Tampere, Finland., Khonina SN; IPSI RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia.; Samara National Research University, 443086 Samara, Russia., Kner P; School of Electrical and Computer Engineering, University of Georgia, Athens, GA 30602 USA., Kravets V; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel., Kumar R; Department of Physics, SRM University - AP, Amaravati, Andhra Pradesh 522502 India., Lai Y; Laboratory of Applied Computational Imaging, Centre Énergie Matériaux Télécommunications, Institut National de la Recherche Scientifique, Université du Québec, Varennes, QC J3X1Pd7 Canada., Li C; Department of Biomedical Engineering, North Carolina State University and University of North Carolina at Chapel Hill, Raleigh, NC 27695 USA.; Comparative Medicine Institute, North Carolina State University, Raleigh, NC 27695 USA., Li J; Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Laboratory (SCILab), School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Research Institute (SCIRI), Nanjing, 210019 Jiangsu China., Li S; School of Electrical and Computer Engineering, University of Georgia, Athens, GA 30602 USA., Li Y; Electrical and Computer Engineering Department, Bioengineering Department, California NanoSystems Institute, University of California, Los Angeles (UCLA), Los Angeles, CA USA., Liang J; Laboratory of Applied Computational Imaging, Centre Énergie Matériaux Télécommunications, Institut National de la Recherche Scientifique, Université du Québec, Varennes, QC J3X1Pd7 Canada., Manavalan G; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel., Mandal AC; Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh 221005 India., Manisha M; Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh 221005 India., Mann C; Department of Applied Physics and Materials Science, Northern Arizona University, Flagstaff, AZ 86011 USA.; Center for Materials Interfaces in Research and Development, Northern Arizona University, Flagstaff, AZ 86011 USA., Marzejon MJ; Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 Sw. A. Boboli St., 02-525 Warsaw, Poland., Moodley C; School of Physics, University of the Witwatersrand, Johannesburg, South Africa., Morikawa J; World Research Hub Initiative (WRHI), Tokyo Institute of Technology, 2-12-1, Ookayama, Tokyo, 152-8550 Japan., Muniraj I; LiFE Lab, Department of Electronics and Communication Engineering, Alliance School of Applied Engineering, Alliance University, Bangalore, Karnataka 562106 India., Narbutis D; Institute of Theoretical Physics and Astronomy, Faculty of Physics, Vilnius University, Sauletekio 9, 10222 Vilnius, Lithuania., Ng SH; Optical Sciences Center and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Computing and Engineering Technologies, Optical Sciences Center, Swinburne University of Technology, Hawthorn, Melbourne, VIC 3122 Australia., Nothlawala F; School of Physics, University of the Witwatersrand, Johannesburg, South Africa., Oh J; Department of Physics, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141 South Korea.; KAIST Institute for Health Science and Technology, KAIST, Daejeon, 34141 South Korea., Ozcan A; Electrical and Computer Engineering Department, Bioengineering Department, California NanoSystems Institute, University of California, Los Angeles (UCLA), Los Angeles, CA USA., Park Y; Department of Physics, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141 South Korea.; KAIST Institute for Health Science and Technology, KAIST, Daejeon, 34141 South Korea.; Tomocube Inc., Daejeon, 34051 South Korea., Porfirev AP; IPSI RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Potcoava M; Department of Anatomy and Cell Biology, University of Illinois at Chicago, 808 South Wood Street, Chicago, IL 60612 USA., Prabhakar S; Quantum Science and Technology Laboratory, Physical Research Laboratory, Navrangpura, Ahmedabad, 380009 India., Pu J; Fujian Provincial Key Laboratory of Light Propagation and Transformation, College of Information Science and Engineering, Huaqiao University, Xiamen, 361021 Fujian China., Rai MR; Department of Biomedical Engineering, North Carolina State University and University of North Carolina at Chapel Hill, Raleigh, NC 27695 USA.; Comparative Medicine Institute, North Carolina State University, Raleigh, NC 27695 USA., Rogalski M; Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 Sw. A. Boboli St., 02-525 Warsaw, Poland., Ryu M; Research Institute for Material and Chemical Measurement, National Metrology Institute of Japan (AIST), 1-1-1 Umezono, Tsukuba, 305-8563 Japan., Choudhary S; Department Chemical Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Shiva, Israel., Salla GR; Department of Physics, SRM University - AP, Amaravati, Andhra Pradesh 522502 India., Schelkens P; Department of Electronics and Informatics (ETRO), Vrije Universiteit Brussel VUB), Pleinlaan 2, 1050 Brussel, Belgium.; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Şener SF; Institute of Materials Science and Nanotechnology, National Nanotechnology Research Center (UNAM), Bilkent University, 06800 Ankara, Turkey.; Department of Physics, Bilkent University, 06800 Ankara, Turkey., Shevkunov I; Computational Imaging Group, Faculty of Information Technology and Communication Sciences, Tampere University, 33100 Tampere, Finland., Shimobaba T; Graduate School of Engineering, Chiba University, 1-33 Yayoi-cho, Inage-ku, Chiba, Chiba Japan., Singh RK; Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh 221005 India., Singh RP; Quantum Science and Technology Laboratory, Physical Research Laboratory, Navrangpura, Ahmedabad, 380009 India., Stern A; School of Electrical and Computer Engineering, Ben-Gurion University of the Negev, 8410501 Beer-Sheva, Israel., Sun J; Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Laboratory (SCILab), School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Research Institute (SCIRI), Nanjing, 210019 Jiangsu China., Zhou S; Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Laboratory (SCILab), School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Research Institute (SCIRI), Nanjing, 210019 Jiangsu China., Zuo C; Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Laboratory (SCILab), School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094 Jiangsu China.; Smart Computational Imaging Research Institute (SCIRI), Nanjing, 210019 Jiangsu China., Zurawski Z; Department of Anatomy and Cell Biology, University of Illinois at Chicago, 808 South Wood Street, Chicago, IL 60612 USA., Tahara T; Applied Electromagnetic Research Center, Radio Research Institute, National Institute of Information and Communications Technology (NICT), 4-2-1 Nukuikitamachi, Koganei, Tokyo 184-8795 Japan., Tiwari V; Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia., Trusiak M; Institute of Micromechanics and Photonics, Warsaw University of Technology, 8 Sw. A. Boboli St., 02-525 Warsaw, Poland., Vinu RV; Fujian Provincial Key Laboratory of Light Propagation and Transformation, College of Information Science and Engineering, Huaqiao University, Xiamen, 361021 Fujian China., Volotovskiy SG; IPSI RAS-Branch of the FSRC 'Crystallography and Photonics' RAS, 443001 Samara, Russia., Yılmaz H; Institute of Materials Science and Nanotechnology, National Nanotechnology Research Center (UNAM), Bilkent University, 06800 Ankara, Turkey., De Aguiar HB; Laboratoire Kastler Brossel, Centre National de la Recherche Scientifique (CNRS) UMR 8552, Sorbonne Universite ´, Ecole Normale Supe ´rieure-Paris Sciences et Lettres (PSL) Research University, Collège de France, 24 rue Lhomond, 75005 Paris, France., Ahluwalia BS; Department of Physics and Technology, UiT The Arctic University of Norway, 9037 Tromsø, Norway., Ahmad A; Department of Physics and Technology, UiT The Arctic University of Norway, 9037 Tromsø, Norway.

Publikováno v: Applied physics. B, Lasers and optics [Appl Phys B] 2024; Vol. 130 (9), pp. 166. Date of Electronic Publication: 2024 Aug 29.