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pro vyhledávání: '"Morgado, Felipe Felipe F."'
Autor:
Katnagallu, Shyam, Morgado, Felipe Felipe F., Mouton, Isabelle, Gault, Baptiste, Stephenson, Leigh T.
Atom probe tomography (APT) helps elucidate the link between the nanoscale chemical variations and physical properties, but it has limited structural resolution. Field ion microscopy (FIM), a predecessor technique to APT, is capable of attaining atom
Externí odkaz:
http://arxiv.org/abs/2103.11010
