Engineering SOI substrates for RF to mm-wave front-ends

Autor: Allibert, F., Andia, L., Morandini, Y., Veytizou, C., Rack, M., Nyssens, L., Raskin, Jean-Pierre, Augendre, E.

Publikováno v: Microwave Journal, p. 72-82 (2020)

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______1493::bfff7b1fafebef189c4a525060f62f7b
https://hdl.handle.net/2078.1/240796

'Silicon High Frequency Test Structures Improvement for Millimeter Wave Varactors Characterization Optimization and Modeling'

Autor: SONNERAT, F., Debroucke, R., Morandini, Y., Gloria, D., Arnould, Jean-Daniel

Publikováno v: IEEE International Conference on Microelectronic Test Structures (ICMTS)
IEEE International Conference on Microelectronic Test Structures (ICMTS), Apr 2011, Amsterdam, Netherlands

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::78893f2ffdc1b837ed693b0e8e8f4939
https://hal.science/hal-01068863

In-situ silicon integrated tuner for automated on-wafer mmW noise parameters extraction of Si HBT and MOSFET in the range 60-110 GHz

Autor: Tagro, Y., Gloria, D., Boret, S., Morandini, Y., Dambrine, Gilles

Publikováno v: Proceedings of 72nd ARFTG Microwave Measurement Symposium
72nd ARFTG Microwave Measurement Symposium
72nd ARFTG Microwave Measurement Symposium, 2008, Portland, OR, United States. pp.119-122, ⟨10.1109/ARFTG.2008.4804284⟩

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::358cb566e6be5e6f8f8637de6fca4eb2
https://hal.archives-ouvertes.fr/hal-00800955

Optical high frequency test structure and test bench definition for on wafer silicon integrated noise source characterization up to 110 GHz based on Germanium-on-Silicon photodiode.

Autor: Oeuvrard, S., Lampin, J.-F., Ducournau, G., Virot, L., Fedeli, J.M., Hartmann, J.M., Danneville, F., Morandini, Y., Gloria, D.

Publikováno v: 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS); 2013, p73-76, 4p

Multiport de-embedding technique for balanced varactor high frequency characterization.

Autor: Morandini, Y., Debroucke, R., Larchanche, J.F., Jan, S., Boret, S., Gloria, D., Pekarik, J.

Publikováno v: 2009 European Microwave Conference (EuMC); 2009, p886-889, 4p