Measurement of the Xe136 two-neutrino double-β-decay half-life via direct background subtraction in NEXT

Autor: Novella, P, Sorel, M, Usón, A, Adams, C, Almazán, H, Álvarez, V, Aparicio, B, Aranburu, AI, Arazi, L, Arnquist, IJ, Ayet, S, Azevedo, CDR, Bailey, K, Ballester, F, Benlloch-Rodríguez, JM, Borges, FIGM, Bounasser, S, Byrnes, N, Cárcel, S, Carrión, JV, Cebrián, S, Church, E, Conde, CAN, Contreras, T, Cossío, FP, Denisenko, AA, Díaz, G, Díaz, J, Dickel, T, Escada, J, Esteve, R, Fahs, A, Felkai, R, Fernandes, LMP, Ferrario, P, Ferreira, AL, Foss, FW, Freitas, EDC, Freixa, Z, Generowicz, J, Goldschmidt, A, Gómez-Cadenas, JJ, González, R, González-Díaz, D, Guenette, R, Gutiérrez, RM, Haefner, J, Hafidi, K, Hauptman, J, Henriques, CAO, Morata, JA Hernando, Herrero-Gómez, P, Herrero, V, Ho, J, Ifergan, Y, Jones, BJP, Kekic, M, Labarga, L, Laing, A, Larizgoitia, L, Lebrun, P, Gutierrez, D Lopez, López-March, N, Losada, M, Mano, RDP, Martín-Albo, J, Martínez, A, Martínez-Lema, G, Martínez-Vara, M, McDonald, AD, Meziani, ZE, Mistry, K, Monrabal, F, Monteiro, CMB, Mora, FJ, Vidal, J Muñoz, Navarro, K, Nygren, DR, Oblak, E, Odriozola-Gimeno, M, Palmeiro, B, Para, A, Pérez, J, Querol, M, Raymond, A, Redwine, AB, Renner, J, Ripoll, L, Rivilla, I, García, Y Rodríguez, Rodríguez, J, Rogero, C, Rogers, L, Romeo, B, Romo-Luque, C, Santos, FP, dos Santos, JMF, Simón, A, Stanford, C, Teixeira, JMR

Publikováno v: Physical Review C, vol 105, iss 5

We report a measurement of the half-life of the Xe136 two-neutrino double-β decay performed with a novel direct-background-subtraction technique. The analysis relies on the data collected with the NEXT-White detector operated with Xe136-enriched and

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______325::a35eb67f1718069850ea718f4fa36e62
https://escholarship.org/uc/item/21g8z7b4

Confirmatory Dimensions of the Attitude Toward Occupational Health

Autor: García-Lirios C, de Nava-Tapía Sl, Vilchis-Mora Fj, Quintero-Soto Ml, Rincon-Ornelas Rm

Publikováno v: Journal of Clinical and Medical Images.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::7dbfa7db82c6532165396a05f9336fe6
https://doi.org/10.47829/jcmi.2021.5803

Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection

Autor: Henriques, CAO, Freitas, EDC, Azevedo, CDR, González-Díaz, D, Mano, RDP, Jorge, MR, Fernandes, LMP, Monteiro, CMB, Gómez-Cadenas, JJ, Álvarez, V, Benlloch-Rodríguez, JM, Borges, FIGM, Botas, A, Cárcel, S, Carríon, JV, Cebrían, S, Conde, CAN, Díaz, J, Diesburg, M, Esteve, R, Felkai, R, Ferrario, P, Ferreira, AL, Goldschmidt, A, Gutiérrez, RM, Hauptman, J, Hernandez, AI, Hernando Morata, JA, Herrero, V, Jones, BJP, Labarga, L, Laing, A, Lebrun, P, Liubarsky, I, López-March, N, Losada, M, Martín-Albo, J, Martínez-Lema, G, Martínez, A, McDonald, AD, Monrabal, F, Mora, FJ, Moutinho, LM, Muñoz Vidal, J, Musti, M, Nebot-Guinot, M, Novella, P, Nygren, DR, Palmeiro, B, Para, A, Pérez, J, Querol, M, Renner, J, Ripoll, L, Rodríguez, J, Rogers, L, Santos, FP, dos Santos, JMF, Simón, A, Sofka, C, Sorel, M, Stiegler, T, Toledo, JF, Torrent, J, Tsamalaidze, Z, Veloso, JFCA, Webb, R, White, JT, Yahlali, N

Publikováno v: Henriques, CAO; Freitas, EDC; Azevedo, CDR; González-Díaz, D; Mano, RDP; Jorge, MR; et al.(2017). Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection. Physics Letters, Section B: Nuclear, Elementary Particle and High-Energy Physics, 773, 663-671. doi: 10.1016/j.physletb.2017.09.017. Lawrence Berkeley National Laboratory: Retrieved from: http://www.escholarship.org/uc/item/3660t0nn

© 2017 The Author Xe–CO2 mixtures are important alternatives to pure xenon in Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification with applications in the important field of rare event detecti

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______325::a8e173c1686bc927109593a9ee5c90dc
http://www.escholarship.org/uc/item/3660t0nn

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