Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Moosup Lim"'
Autor:
Dongsuk Yoo, Youngtae Jang, Youngchan Kim, Jihun Shin, Kangsun Lee, Seok-Yong Park, Seungho Shin, Hongsuk Lee, Seojoo Kim, Joongseok Park, Cheonho Park, Moosup Lim, Hyungjin Bae, Soeun Park, Minwook Jung, Sungkwan Kim, Shinyeol Choi, Sejun Kim, Jinkyeong Heo, Hojoon Lee, KyungChoon Lee, Youngkyun Jeong, Youngsun Oh, Min-Sun Keel, Bumsuk Kim, Haechang Lee, JungChak Ahn
Publikováno v:
Sensors, Vol 23, Iss 22, p 9150 (2023)
An automotive 2.1 μm CMOS image sensor has been developed with a full-depth deep trench isolation and an advanced readout circuit technology. To achieve a high dynamic range, we employ a sub-pixel structure featuring a high conversion gain of a larg
Externí odkaz:
https://doaj.org/article/2c6eb648d7bb4a73967e561b5a471be1
Autor:
Youngsun Oh, Jungwook Lim, Soeun Park, Dongsuk Yoo, Moosup Lim, Joongseok Park, Seojoo Kim, Minwook Jung, Sungkwan Kim, Junetaeg Lee, In-Gyu Baek, Kwangyul Ryu, Kyungmin Kim, Youngtae Jang, Min-Sun Keel, Gyujin Bae, Seunghun Yoo, Youngkyun Jeong, Bumsuk Kim, Jungchak Ahn, Haechang Lee, Joonseo Yim
Publikováno v:
2022 International Electron Devices Meeting (IEDM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e3e9bf537be6914997706449eda5171
https://doi.org/10.1109/iedm45625.2022.10019558
https://doi.org/10.1109/iedm45625.2022.10019558
Autor:
JungChak Ahn, Chang-Rok Moon, Bumsuk Kim, Kyungho Lee, Yitae Kim, Moosup Lim, Wook Lee, Heemin Park, Kyoungsik Moon, Jaeryung Yoo, YongJei Lee, ByungJun Park, Sangil Jung, Junetaeg Lee, Tae-Hun Lee, YunKi Lee, Junghoon Jung, Jin-Hak Kim, Tae-Chan Kim, Hyunwoo Cho
Publikováno v:
2008 IEEE International Electron Devices Meeting; 2008, p1-4, 4p