Zobrazeno 1 - 10
of 124
pro vyhledávání: '"Moon-Yong Lee"'
Publikováno v:
International Journal of Precision Engineering and Manufacturing. 18:1111-1117
A roll-to-roll (R2R) thermal evaporation system was developed to manufacture low-cost flexible OLEDs. A vacuum-compatible bottom-up thermal evaporation method was adopted to ensure the quality and the stability of the thin film. DSMC (Direct Simulati
Publikováno v:
2018 25th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD).
This paper presents the development of roll-to-roll thermal evaporation equipment for flexible OLED devices. Under high vacuum conditions, the continuous movement of the flexible film was precisely controlled by the developed roll-to-roll method. And
Publikováno v:
Journal of the Korean Oil Chemists Society. 30:528-539
Publikováno v:
Journal of Materials Processing Technology. 194:1-6
Tubular bellows are one of the most efficient energy-absorbing elements for various automotive systems. The conventional manufacturing of metallic tubular bellows consists of a four-step process: (1) deep drawing, (2) ironing, (3) tube bulging, and (
Autor:
Hwang, Cheol Seong, Lee, Byoung Taek, Chang Seok Kang, Jin Won Kim, Ki Hoon Lee, Hag-Ju Cho, Hideki Horii, Wan Don Kim, Sang In Lee, Young Bum Roh, Moon Yong Lee
Publikováno v:
Journal of Applied Physics; 4/1/1998, Vol. 83 Issue 7, p3703, 11p, 13 Diagrams, 23 Graphs
Deformation Behaviors of 6061 and 7075 Aluminum Tubes at Elevated Temperatures for Warm Hydroforming
Publikováno v:
Materials Science Forum. :373-376
The deformation behaviors of fully annealed or T6-treated 6061 and 7075 aluminum tubes are investigated at elevated temperature using uniaxial tensile test. Fully annealed 6061 and 7075 tube, and T6-treated 7075 tube do not show sharp local necking w
Autor:
Hong-bae Park, Suk Ho Joo, Sang-In Lee, Moon Yong Lee, Chang Seok Kang, Cha Young Yoo, Byoung Taek Lee, Wan Don Kim, Horii Hideki, Ki Hoon Lee, Han-jin Lim
Publikováno v:
Journal of Electronic Materials. 28:L9-L12
The influence of two-step deposition on the electrical properties of sputtered (Ba,Sr)TiO3 thin films was investigated. BST thin films with thickness 40 nm were deposited by a simple two-step radio frequency-magnetron sputtering technique, where the
Publikováno v:
Proceedings of SPIE; 2/18/2017, Vol. 10273, p11-29, 19p
Autor:
In Seon Park, Sang-In Lee, Young Bum Koh, Cha Young Yoo, Sang-min Lee, Sejun Oh, Moon Yong Lee, Byueng Hee Kim
Publikováno v:
Integrated Ferroelectrics. 20:225-239
Degradation of ferroelectric properties of Pt/Pb(Zr,Ti)O3/Pt capacitor by the back-end process of ferroelectric random access memory (FRAM) device fabrication process was studied, particularly by the interlayer dielectric (ILD). The influence of ILD
Autor:
Moon Yong Lee, Myoung Bum Lee, Jung-min Ha, Young Bum Koh, U. In Chung, Sang-In Lee, Young Wook Park, Byung Lyul Park, Hyeon Deok Lee, Young-sun Kim, Dae Hong Ko
Publikováno v:
Journal of Electronic Materials. 26:L1-L5
We have developed tungsten nitride (W-Nitride) films grown by plasma enhanced chemical vapor deposition (PECVD) for barrier material applications in ultra large scale integration DRAM devices. As-deposited W-Nitride films show an amorphous structure,