PASS: Pattern-Sequence-Authentication-Based Secure Scan Against Reverse Engineering Attacks

Autor: Jang, Seokjun, Moon, Youngki, Won, Duyeon, Kang, Sungho

Publikováno v: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems; January 2025, Vol. 44 Issue: 1 p52-64, 13p