Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Montserrat, Nafría"'
Autor:
Giovanni, Vescio, Gemma, Martín, Albert, Crespo-Yepes, Sergi, Claramunt, Daniel, Alonso, Julian, López-Vidrier, Sonia, Estradé, Marc, Porti, Rosana, Rodríguez, Francesca, Peiró, Albert, Cornet, Albert, Cirera, Montserrat, Nafría
Publikováno v:
ACS applied materialsinterfaces. 11(26)
Low-power, high-performance metal-insulator-metal (MIM) non-volatile resistive memories based on HfO
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::d327a5850577512914c0ec8622c6b1f1
https://pubmed.ncbi.nlm.nih.gov/31180626
https://pubmed.ncbi.nlm.nih.gov/31180626
Autor:
Arnal, August, Crespo-Yepes, Albert, Ramon, Eloi, Teres, Lluis, Rodriguez, Rosana, Nafria, Montserrat
Publikováno v:
IEEE Electron Device Letters; Oct2020, Vol. 41 Issue 10, p1512-1515, 4p
Conference
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Autor:
Maestro-Izquierdo, Marcos, Martin-Martinez, Javier, Yepes, Albert Crespo, Rodríguez, Rosana, Nafría, Montserrat, Aymerich, Xavier, Escudero, Manel, Rubio, Antonio
Publikováno v:
IEEE Transactions on Electron Devices; Feb2018, Vol. 65 Issue 2, p404-410, 7p
Autor:
Pedró, Marta1 (AUTHOR) javier.martin.martinez@uab.es, Martín-Martínez, Javier1 (AUTHOR) rosana.rodriguez@uab.es, Maestro-Izquierdo, Marcos2 (AUTHOR) marcos.maestro@imb-cnm.csic.es, Rodríguez, Rosana1 (AUTHOR) montse.nafria@uab.es, Nafría, Montserrat1 (AUTHOR)
Publikováno v:
Materials (1996-1944). 11/1/2019, Vol. 12 Issue 21, p3482. 1p. 7 Diagrams, 7 Graphs.
Publikováno v:
2015 International Workshop on CMOS Variability (VARI); 2015, pi-xxi, 21p
Autor:
Smith, Michael smithmj@btinternet.com
Publikováno v:
SMT: Surface Mount Technology. May2012, Vol. 27 Issue 5, p16-24. 6p.
Autor:
Gonzalez, Mireia Bargallo, Martin-Martinez, Javier, Maestro, Marcos, Acero, Maria Cruz, Nafria, Montserrat, Campabadal, Francesca
Publikováno v:
IEEE Transactions on Electron Devices; Aug2016, Vol. 63 Issue 8, p3116-3122, 7p
Publikováno v:
2015 10th Spanish Conference on Electron Devices (CDE); 2015, p1-2, 2p
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detec
