Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Monteith G. Heaton"'
Autor:
Monteith G. Heaton, Jason Cleveland
Publikováno v:
Microscopy Today. 17:26-29
Over the past decade, Atomic Force/Scanning Probe Microscopy (AFM/SPM) has emerged as the leading tool for investigations at the nanoscale – doing everything from imaging, to compositional differentiation, to explorations of molecular forces. Howev
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed0e9c364fd5484f915d04a57b97bbde
https://doi.org/10.1017/s1551929500054456
https://doi.org/10.1017/s1551929500054456
Autor:
John S. Foster, Monteith G. Heaton
Publikováno v:
Microelectromechanical Systems.
MEMS industry has seen mixed success over the last decade or so. Today, there are only a limited number of MEMS products available on the market, notably airbag accelerometers, desktop inkjet print heads and pressure sensors for automotive and biomed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0601d034333ef5e69c9c8c675b44fab2
https://doi.org/10.1115/imece2002-32747
https://doi.org/10.1115/imece2002-32747
Publikováno v:
Solid State Technology. Mar96 Supplement, Vol. 39 Issue 3, p1. 303p.
Publikováno v:
Laser Focus World. Dec95 Buyers Guide '96, Vol. 31 Issue 12, p682. 159p.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Publikováno v:
Journal of Automated Methods & Management in Chemistry; 1993, Vol. 15 Issue 3, p85-120, 36p
Autor:
Heaton, Monteith G., Serry, F. Michael
Publikováno v:
R&D Magazine. Jun2001, Vol. 43 Issue 6, p28. 2p.
Autor:
Heaton, Monteith G.1 monte@imtmems.com
Publikováno v:
R&D Magazine. Jul2005, Vol. 47 Issue 7, p31-31. 1p. 1 Diagram, 1 Graph.
Autor:
Heaton, Monteith G.1
Publikováno v:
R&D Magazine. Jul2004, Vol. 46 Issue 7, p33-33. 1p. 2 Graphs.