Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Mont FW"'
Autor:
Poxson DJ; Rensselaer Nanotechnology Center, Rensselaer Polytechnic Institute, 110 Eighth Street, Troy, New York 12180, USA. poxsod2@rpi.edu, Mont FW, Cho J, Schubert EF, Siegel RW
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2012 Nov; Vol. 4 (11), pp. 6295-301. Date of Electronic Publication: 2012 Nov 12.
Autor:
Sood AW; Department of Electrical, Computer and Systems Engineering, and Rensselaer Nanotechnology Center, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Poxson DJ, Mont FW, Chhajed S, Cho J, Schubert EF, Welser RE, Dhar NK, Sood AK
Publikováno v:
Journal of nanoscience and nanotechnology [J Nanosci Nanotechnol] 2012 May; Vol. 12 (5), pp. 3950-3.
Autor:
Poxson DJ; Rensselaer Nanotechnology Center, Rensselaer Polytechnic Institute, 110 Eighth Street, Troy, New York 12180, USA., Mont FW, Schubert MF, Kim JK, Cho J, Schubert EF
Publikováno v:
Optics express [Opt Express] 2010 Nov 08; Vol. 18 Suppl 4, pp. A594-9.
Autor:
Poxson DJ; Department of Physics, Applied Physics, and Astronomy, Future Chips Constellation, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Schubert MF, Mont FW, Schubert EF, Kim JK
Publikováno v:
Optics letters [Opt Lett] 2009 Mar 15; Vol. 34 (6), pp. 728-30.
Autor:
Schubert MF; Future Chips Constellation, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Mont FW, Chhajed S, Poxson DJ, Kim JK, Schubert EF
Publikováno v:
Optics express [Opt Express] 2008 Apr 14; Vol. 16 (8), pp. 5290-8.