Zobrazeno 1 - 10
of 64
pro vyhledávání: '"Monnereau, N."'
Publikováno v:
In Microelectronics Reliability February 2013 53(2):221-228
Publikováno v:
Proceedings of the 10th Int. Symposium on Electromagnetic Compatibility (EMC Europe 2011)
Int. Symposium on Electromagnetic Compatibility (EMC Europe 2011)
Int. Symposium on Electromagnetic Compatibility (EMC Europe 2011), Sep 2011, YORK, United Kingdom. pp.457-463
Scopus-Elsevier
Int. Symposium on Electromagnetic Compatibility (EMC Europe 2011)
Int. Symposium on Electromagnetic Compatibility (EMC Europe 2011), Sep 2011, YORK, United Kingdom. pp.457-463
Scopus-Elsevier
International audience; In this paper, a behavioral modeling methodology to predict ElectroStatic-Discharge (ESD) failures at system level is proposed and validated. The proposed models enable time domain simulation to determine voltage and current w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::8dfeddc0b809edcd858a226f853d7084
https://hal.archives-ouvertes.fr/hal-00722643
https://hal.archives-ouvertes.fr/hal-00722643
Publikováno v:
2011 33rd NO POD PERMISSION Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD); 2011, p1-6, 6p
Autor:
Besse, P., Lafon, F., Monnereau, N., Caignet, F., Laine, J.P., Salles, A., Rigour, S., Bafleur, M., Nolhier, N., Tremouilles, D.
Publikováno v:
2011 33rd NO POD PERMISSION Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD); 2011, p1-9, 9p
Publikováno v:
2010 32nd Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD); 2010, p1-10, 10p
Autor:
Chen, Xiaoping, Liang, Hui, He, Xitong, Li, Weiqiang, Nian, Zhiyao, Mahmood, Zafar, Huo, Yanping, Ji, Shaomin
Publikováno v:
Chemical Communications; 10/11/2024, Vol. 60 Issue 79, p11132-11135, 4p
Autor:
Sánchez, Darío Puchán, Morice, Korentin, Mutovska, Monika G., Khrouz, Lhoussain, Josse, Pierre, Allain, Magali, Gohier, Frédéric, Blanchard, Philippe, Monnereau, Cyrille, Le Bahers, Tangui, Sabouri, Nasim, Zagranyarski, Yulian, Cabanetos, Clement, Deiana, Marco
Publikováno v:
Journal of Materials Chemistry B; 9/7/2024, Vol. 12 Issue 33, p8107-8121, 15p
Autor:
Alexopoulos, Aris, Neudegg, David
Publikováno v:
Foundations (2673-9321); Sep2024, Vol. 4 Issue 3, p376-410, 35p
Publikováno v:
Nanoscale Horizons; Sep2024, Vol. 9 Issue 9, p1390-1416, 27p
Autor:
Mohanty P; School of Chemical Sciences, National Institute of Science Education and Research (NISER), PO-Bhimpur-Padanpur Via-Jatni, District-Khurda, PIN-752050, Bhubaneswar, India.; Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai, 400094, India., Sarang S; School of Chemical Sciences, National Institute of Science Education and Research (NISER), PO-Bhimpur-Padanpur Via-Jatni, District-Khurda, PIN-752050, Bhubaneswar, India.; Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai, 400094, India., Rout S; School of Chemical Sciences, National Institute of Science Education and Research (NISER), PO-Bhimpur-Padanpur Via-Jatni, District-Khurda, PIN-752050, Bhubaneswar, India.; Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai, 400094, India., Biswal HS; School of Chemical Sciences, National Institute of Science Education and Research (NISER), PO-Bhimpur-Padanpur Via-Jatni, District-Khurda, PIN-752050, Bhubaneswar, India.; Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai, 400094, India.
Publikováno v:
Chemphyschem : a European journal of chemical physics and physical chemistry [Chemphyschem] 2024 Dec 16; Vol. 25 (24), pp. e202400636. Date of Electronic Publication: 2024 Nov 04.