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Autor:
Decams, J.M., Guillon, H., Jiménez, Carmen, Audier, Marc, Sénateur, J.P., Dubourdieu, Catherine, Cadix, O., O'Sullivan, B.J., Mondreanu, M., Hurley, P.K., Rushworth, S., Leedham, T.J., Davies, H., Fang, Q., Boyd, I.
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2005, 45, pp.929
Microelectronics Reliability, Elsevier, 2005, 45, pp.929
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::d4452cff6512ac63fe647ba958e0cc6e
https://hal.archives-ouvertes.fr/hal-00135043
https://hal.archives-ouvertes.fr/hal-00135043
