Zobrazeno 1 - 10
of 62
pro vyhledávání: '"Moll Echeto, Francisco de Borja"'
Autor:
Fornt Mas, Jordi, Jin, Leixin, Etxezarreta, Imanol, Fontova, Pau, Altet Sanahujes, Josep, Calomarde Palomino, Antonio, Morancho Llena, Enrique, Moll Echeto, Francisco de Borja, Rubio Sola, Jose Antonio
Publikováno v:
2022 37th Conference on Design of Circuits and Integrated Circuits (DCIS).
© 2022 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new c
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Universitat Politècnica de Catalunya (UPC)
Poster - 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS) This paper employs a linear, discrete-time State- Space model of a CMOS Cross-Coupled Charge Pump (CCCP.) The discrete-time model is based on the analytic solution of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::33a7db537496ebc092f21bb2bb739b61
https://hdl.handle.net/2117/366462
https://hdl.handle.net/2117/366462
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
The lack of high power conversion efficiency in RF passive rectifier circuits at sub-µW power levels with current MOSFET technologies is directly related with the difficulty of the transistors in conducting the required level of current at low volta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::34196431a83a731cbf020c3ce49e045f
http://hdl.handle.net/2117/85309
http://hdl.handle.net/2117/85309
Autor:
Altet Sanahujes, Josep, Gómez Salinas, Dídac, Dufis, Cédric Yvan, González Jiménez, José Luis, Mateo Peña, Diego, Aragonès Cervera, Xavier, Moll Echeto, Francisco de Borja, Rubio Sola, Jose Antonio
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
The temperature at surface of a silicon die depends on the activity of the circuits placed on it. In this paper, it is analyzed how Process, Voltage and Temperature (PVT) variations affect simultaneously some figures of merit (FoM) of some digital an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::cba049e10eb06a3adf9f869a7856be0e
https://hdl.handle.net/2117/11126
https://hdl.handle.net/2117/11126
Autor:
García Leyva, Lancelot, Rubio Sola, Jose Antonio, Moll Echeto, Francisco de Borja, Calomarde Palomino, Antonio
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
Future electronic devices are expected to operate at lower voltage supply to save power, especially in ultimate and new technologies. The resulting reduction of logic levels approaches the thermal noise limit, and consequently signal to noise margins
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::dde0ab6ee462de9b9627209ccd19ea5e
http://hdl.handle.net/2117/11234
http://hdl.handle.net/2117/11234
Publikováno v:
Recercat. Dipósit de la Recerca de Catalunya
instname
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
instname
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
As semiconductor technology advances into the nanoscale era, optical effects such as channel narrowing, corner rounding or line-end pullback are critical to accomplish circuit yield specifications. It is well-demonstrated that layout regularity reduc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a4c8eabe1721e981b3af3196ced3806a
https://hdl.handle.net/2117/10393
https://hdl.handle.net/2117/10393
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
A new trend that is becoming dominant is to improve layout regularity so that the layouts to be printed are more repetitive and easy to manufacture. Our proposal is to push to the limit layout regularity to minimize manufacturing costs.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::5b049e07fba29e6404ae3e0f6505d113
http://hdl.handle.net/2117/11235
http://hdl.handle.net/2117/11235
Autor:
Andrade Miceli, Dennis Michael, Martorell Cid, Ferran, Moll Echeto, Francisco de Borja, Rubio Sola, Jose Antonio
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
The supply voltage decrease and power consumption increase of modern ICs made the requirements for low voltage fluctuation caused by packaging and on-chip parasitic impedances more difficult to achieve. Most of the research works on the area assume t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::50bb6cec7271140fbfa9628774d2392c
http://hdl.handle.net/2117/1486
http://hdl.handle.net/2117/1486
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
Universitat Politècnica de Catalunya (UPC)
Recercat. Dipósit de la Recerca de Catalunya
instname
This report presents a fast method of evaluating the power consumption of a bus. Given an on-chip bus driver-interconnection-receiver design of N parallel lines,the objective is to develop its energy consumption macro-model. With this model we are be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4a133c304d02eefc71e01b65dcf115cf
https://hdl.handle.net/2117/1232
https://hdl.handle.net/2117/1232
Autor:
Rubio Sola, Jose Antonio, Altet Sanahujes, Josep, Aragonès Cervera, Xavier, González Jiménez, José Luis, Mateo Peña, Diego, Moll Echeto, Francisco de Borja
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Universitat Politècnica de Catalunya (UPC)
La tecnología de circuitos integrados, basada principalmente en la miniaturización de los circuitos ha evolucionado intensamente en los últimos tiempos. El objetivo de esta obra es dar a conocer esta evolución reciente y futura, sus posibilidades
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::17e6897d6669810ab581736f12b3d69a
http://hdl.handle.net/2099.3/36851
http://hdl.handle.net/2099.3/36851