Innovative soft magnetic multilayers with enhanced in-plane anisotropy and ferromagnetic resonance frequency for integrated RF passive devices

Autor: Claudiu V. Falub, Martin Bless, Rachid Hida, Mojmír Meduňa, Arnold Ammann

Publikováno v: AIP Advances, Vol 8, Iss 4, Pp 048002-048002-14 (2018)

We present an innovative, economical method for manufacturing soft magnetic materials that may pave the way for integrated thin film magnetic cores with dramatically improved properties. Soft magnetic multilayered thin films based on the Fe-28%Co20

Externí odkaz: https://doaj.org/article/b75f7bcf09b94c32ae04fb1f6c49956e

X-ray rocking curve imaging on large arrays of extremely tall SiGe microcrystals epitaxial on Si

Autor: Emanuil Choumas, Mojmír Meduňa, Ondřej Caha, Franco Bressan, Hans von Känel

Publikováno v: Journal of Applied Crystallography. 54:1071-1080

This work investigates layers of densely spaced SiGe microcrystals epitaxially formed on patterned Si and grown up to extreme heights of 40 and 100 µm using the rocking curve imaging technique with standard laboratory equipment and a 2D X-ray pixel

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c4075c4e0b5c8698f199a9c86d5f3443
https://doi.org/10.1107/s1600576721004969

X-ray diffraction on stacking faults in 3C-SiC epitaxial microcrystals grown on patterned Si(0 0 1) wafers

Autor: Mojmír Meduňa, Hans von Känel, Danilo Crippa, Fulvio Mancarella, Marco Mauceri, Marco Puglisi, Thomas Kreiliger, Leo Miglio, Francesco La Via

Publikováno v: Journal of Crystal Growth. 507:70-76

We present an investigation of the structural quality of arrays of 3C-SiC micropillars and microridges grown epitaxially on deeply etched Si(0 0 1) substrates offcut towards [1 1 0]. Using high resolution X-ray diffraction with reciprocal space mappi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::927de67618ed4e113aa7d1c4ed4dee38
https://doi.org/10.1016/j.jcrysgro.2018.10.046

Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals

Autor: Anna Marzegalli, Mojmír Meduňa, Hans von Känel, Kai Zweiacker, Leo Miglio, Fabio Isa, Arik Jung, M Albani, Giovanni Isella

Publikováno v: Journal of Applied Crystallography. 51:368-385

The scanning X-ray nanodiffraction technique is used to reconstruct the three-dimensional distribution of lattice strain and Ge concentration in compositionally graded Si1−x Ge x microcrystals grown epitaxially on Si pillars. The reconstructed crys

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5f2dec47c632a5e5c95943c84c1b1c6f
https://doi.org/10.1107/s1600576718001450

Enhanced permeability dielectric FeCo/Al2O3 multilayer thin films with tailored properties deposited by magnetron sputtering on silicon

Autor: Xue Zhao, Claudiu V. Falub, Pietambaram Srinivas, Jan Ambrosini, Oguz Yildirim, Ondrej Caha, Mojmír Meduňa, Rachid Hida, Hans J. Hug, Hartmut Rohrmann

Publikováno v: AIP Advances
AIP Advances, American Institute of Physics-AIP Publishing LLC, 2019, 9 (3), ⟨10.1063/1.5079477⟩
AIP Advances, 2019, 9 (3), ⟨10.1063/1.5079477⟩
AIP Advances, Vol 9, Iss 3, Pp 035243-035243-6 (2019)

International audience; We have studied the structural and magnetic properties of enhanced-permeability-dielectric FeCo/Al2O3-multilayer thin films deposited on 8 ''-Si wafers in an industrial magnetron sputtering system. The EPD-multilayers consist

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9ae7457a740215c938b36017d59882f6
https://hal-cea.archives-ouvertes.fr/cea-02186483