Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Mojing Liu"'
Autor:
Brett H. Meyer, Mojing Liu
Publikováno v:
DFT
Latent soft errors may disrupt execution millions of instructions after their occurrence, wasting significant computational resources when recovery requires re-execution. While Execution Fingerprinting (EF) has emerged as a cost-effective fault detec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::208a3ca51074bd7f4fcf98352491814d
https://doi.org/10.1109/dft.2016.7684068
https://doi.org/10.1109/dft.2016.7684068
Publikováno v:
ACM Great Lakes Symposium on VLSI
Recent studies have shown a dramatic increase in multi-bit upset (MBU) events and related errors as transistors continue to shrink.To assist designers with addressing MBU in microprocessor register files, we have extended an architectural description
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a04951e12272daa7df779206fd2423c
https://doi.org/10.1145/2591513.2591538
https://doi.org/10.1145/2591513.2591538
Publikováno v:
SAE Technical Paper Series.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c663e2f12d3a3cc6b99a0bc8eb79be53
https://doi.org/10.4271/2013-01-2287
https://doi.org/10.4271/2013-01-2287
Publikováno v:
ACM Transactions on Embedded Computing Systems; May2017, Vol. 16 Issue 4, p1-20, 20p
Autor:
Liu, Mojing, Meyer, Brett H.
Publikováno v:
2016 IEEE International Symposium on Defect & Fault Tolerance in VLSI & Nanotechnology Systems (DFT); 2016, p47-52, 6p
Publikováno v:
2016 IEEE International Symposium on Defect & Fault Tolerance in VLSI & Nanotechnology Systems (DFT); 2016, pv-vii, 3p
Seki was a Japanese mathematician in the seventeenth century known for his outstanding achievements, including the elimination theory of systems of algebraic equations, which preceded the works of Étienne Bézout and Leonhard Euler by 80 years. Seki
