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pro vyhledávání: '"Mohsen Shokrani"'
Autor:
Mohsen Shokrani, Bhola N. De
Publikováno v:
ECS Transactions. 6:415-429
We have developed a novel test method for on-wafer measurement of median time to failure (MTTF) of MIMCAP dielectric under an applied electric field using the concept of Time Dependent Dielectric Breakdown (TDDB). This method requires a small number
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f91bc582234d7c1727ed4f8f02f2eec2
https://doi.org/10.1149/1.2728811
https://doi.org/10.1149/1.2728811
