Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Mohammed Issam Younis"'
Autor:
Mohammed Issam Younis
Publikováno v:
Journal of Engineering, Vol 20, Iss 07 (2023)
This paper proposes a collaborative system called Recycle Rewarding System (RRS), and focuses on the aspect of using information communication technology (ICT) as a tool to promote greening. The idea behind RRS is to encourage recycling collectors by
Externí odkaz:
https://doaj.org/article/490544c530484ae58140f7dbd5356dc1
Publikováno v:
Baghdad Science Journal, Vol 17, Iss 3(Suppl.) (2020)
Software testing is a vital part of the software development life cycle. In many cases, the system under test has more than one input making the testing efforts for every exhaustive combination impossible (i.e. the time of execution of the test case
Externí odkaz:
https://doaj.org/article/6d1fb8c56c4f44dc8f6858c5701e4de6
Autor:
Mohammed Issam Younis
Publikováno v:
Baghdad Science Journal, Vol 17, Iss 2 (2020)
Sequence covering array (SCA) generation is an active research area in recent years. Unlike the sequence-less covering arrays (CA), the order of sequence varies in the test case generation process. This paper reviews the state-of-the-art of the SCA s
Externí odkaz:
https://doaj.org/article/88a035eec80a40f2a5981200f53cdaaa
Publikováno v:
Journal of Engineering, Vol 21, Iss 6, Pp 15-36 (2015)
With the development of computer architecture and its technologies in recent years, applications like e-commerce, e-government, e-governance and e-finance are widely used, and they act as active research areas. In addition, in order to increase the q
Externí odkaz:
https://doaj.org/article/09333f8c95b54cb0bbc98681ba112b6d
Publikováno v:
Electronics; Volume 11; Issue 18; Pages: 2885
Today’s academics have a major hurdle in solving combinatorial problems in the actual world. It is nevertheless possible to use optimization techniques to find, design, and solve a genuine optimal solution to a particular problem, despite the limit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7b49c2983b6f2aa6e0208eaa02784a91
https://doi.org/10.3390/electronics11182885
https://doi.org/10.3390/electronics11182885