Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Mohammed Fakhruddin"'
Publikováno v:
2022 44th Annual EOS/ESD Symposium (EOS/ESD).
Publikováno v:
ISQED
The proposed verification methodology enables designers to meet a maximum resistance specification for the well taps routing. Key strengths of the flow are: automatic identification of both well taps and VDD/VSS grid; comparison of the extracted resi
Autor:
Larry Horwitz, Michael J. Hart, Vassili Kireev, Matthew Hogan, Mohammed Fakhruddin, James Karp
Publikováno v:
MWSCAS
Custom ESD protection without increasing loading capacitance is demonstrated for transmitter (TX) and receiver (RX) pins of the Xilinx Zynq UltraScale+ Microprocessor System-on-Chip (MPSoC) transceivers. Optimized T-coil cancellation was applied at a
Autor:
Mohammed Fakhruddin, Phoumra Tan, James Karp, Rawat Mini, Vassili Kireev, Dean Tsaggaris, Michael J. Hart
Publikováno v:
2016 IEEE International Reliability Physics Symposium (IRPS).
Methodology proposed that relates 200V CDM voltage specification of S20.20-2014 standard to a realistic 100–200mA CDM peak current for inter-die interfaces. Tribology is considered to be the source of charge accumulation on the bare die during 3D/2
Autor:
Kaur Keer, Priyameet, Nijhawan, Ginni, Kiran Kumar, Mamidi, Pahwa, Shilpa, Kalra, Ravi, Abdulhussein Al-Allak, Mustafa, Kumar, P. Pramod
Publikováno v:
E3S Web of Conferences; 7/23/2024, Vol. 552, p1-11, 11p
Autor:
Mukhopadhyay, Aju
Publikováno v:
Poetcrit; Jul-Dec2023, Vol. 36 Issue 2, p44-54, 11p
Autor:
Sevea, Terenjit
Publikováno v:
Islamic Connections: Muslim Societies in South & Southeast Asia. 2009, p149-174. 26p.
Autor:
Pande, Suresh Chandra
Publikováno v:
Poetcrit; Jan-Jun2021, Vol. 34 Issue 1, p115-124, 10p
Publikováno v:
Pollack Periodica; Dec2020, Vol. 15 Issue 3, p79-90, 12p
Autor:
Khetarpal, Dalip Kumar
Publikováno v:
Poetcrit; Jul-Dec2019, Vol. 32 Issue 2, p95-101, 7p