Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Mohammad Kamruzzaman Chowdhury"'
Publikováno v:
International Symposium on Microelectronics. 2010:000505-000512
The objective of the research is to understand the effect of chemical treatment's etching times on via wall roughness; and the direct current (DC) and reverse pulse plating (RPP) of vias fabricated using micro mechanical punching process on liquid cr
Autor:
Hugo Bender, Roger Loo, J.P. Lu, Andriy Hikavyy, B. Vissouvanadin, Vladimir Machkaoutsan, Mohammad Kamruzzaman Chowdhury, Peter Verheyen, Pierre Tomasini, Cor Claeys, S.G Thomas, Eddy Simoen, R. Wise, J.W. Weijtmans, Mireia Bargallo Gonzalez
Publikováno v:
IEEE Transactions on Electron Devices. 55:925-930
This paper studies the leakage current components in embedded Si1-x,Gex, source/drain (S/D) p+-n junctions, with different Ge contents, varying between 20% and 35%. In addition, the impact of performing a highly doped drain (HDD) implantation before
Autor:
Frederik Leys, Shawn G. Thomas, R. Wise, Roger Loo, J.W. Weijtmans, Nada Bhouri, Cor Claeys, Peter Verheyen, Vladimir Machkaoutsan, J.P. Lu, Eddy Simoen, Pierre Tomasini, Mireia Bargallo Gonzalez, Olivier Richard, Mohammad Kamruzzaman Chowdhury
Publikováno v:
ECS Transactions. 6:389-396
This paper presents an investigation of the effect of the relaxation on the electrical performance of recessed Si1-xGex source/drain junctions. It is shown, that the peripheral leakage current density scales exponentially with the total epilayer thic
Publikováno v:
2010 Proceedings 60th Electronic Components and Technology Conference (ECTC).
The purpose of this paper is to present new findings in process variability for wet chemical etching and subsequent plasma cleaning of mechanically punched micro vias fabricated in liquid crystal polymer (LCP) substrate. It was observed that the micr
Autor:
Cor Claeys, Eddy Simoen, Mohammad Kamruzzaman Chowdhury, Nada Bhouri, Peter Verheyen, Frederik Leys, Olivier Richard, Roger Loo, Vladimir Machkaoutsan, Pierre Tomasini, Shawn Thomas, Jiong Ping Lu, J.W Weijtmans, R. Wise
Publikováno v:
ECS Meeting Abstracts. :601-601
not Available.