Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Mohamed Boucherit"'
Autor:
Mohamed Najah, Serge Ecoffey, Tejinder Singh, Mark Ferguson, Louis-Philippe Roby, Jacques Renaud, Paul Gondcharton, Frederic A. Banville, Mohamed Boucherit, Serge A. Charlebois, Luc G. Frechette, Raafat R. Mansour, Francois Boone
Publikováno v:
Journal of Microelectromechanical Systems. 31:700-711
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::913df67bba6220a673fdf5db66218785
https://doi.org/10.1109/jmems.2022.3172920
https://doi.org/10.1109/jmems.2022.3172920
Autor:
Abdelmadjid, Gouichiche, Mohamed, Boucherit Seghir, Mohamed, Tadjine, Ahmed, Safa, Youcef, Messlem
Publikováno v:
In Electric Power Systems Research November 2013 104:129-137
Autor:
Mark Ferguson, Mohamed Najah, Frederic A. Banville, Mohamed Boucherit, Paul Gond-Charton, Jacques Renaud, Luc Frechette, Francois Boone, Serge Ecoffey, Serge A. Charlebois
We explore compatibility of Ru with Al-Ge eutectic wafer bonding. We first present experiments to check for the presence of Ru ternary alloy poisoning inhibiting Al-Ge melting as well as evaluations of Al-Ge melt wettability on Ru and diffusion outco
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9c3f15accb21ac2292e9b9c9b0a0a926
https://doi.org/10.36227/techrxiv.19319495.v1
https://doi.org/10.36227/techrxiv.19319495.v1
Autor:
Serge Charlebois, Serge Ecoffey, Francois Boone, Luc Frechette, Jacques Renaud, Naresh Miriyala, Mohamed Boucherit, Frederic Banville, Mohamed Najah, Mark Ferguson
Publikováno v:
Journal of The Electrochemical Society. 169:083504
We investigate the re-entrant undercut profile resulting from Au wet etching for patterning micron range thick films using an aqua regia-based solution in comparison with an iodine-iodide-based commercial etchant. Our work discriminates between two u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::21ad1100d4039be90930495cb90d5fa7
https://doi.org/10.1149/1945-7111/ac8769
https://doi.org/10.1149/1945-7111/ac8769
Autor:
Francois Boone, Serge A. Charlebois, Mark Ferguson, Mohamed Boucherit, Farouk Maaboudallah, Mohamed Najah, Serge Ecoffey, Luc G. Fréchette
Publikováno v:
Tribology International. 165:107339
In the fabrication of microelectronic devices, sputtering of thin films leads to isotropic rough surfaces described by (i) a Gaussian height distribution and (ii) a constant power spectral density (PSD) up to a roll-off frequency of q0 from which it
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::677b8d6c30d12a9e9760804da0ffe061
https://doi.org/10.1016/j.triboint.2021.107339
https://doi.org/10.1016/j.triboint.2021.107339
Publikováno v:
2012 2nd International eConference on Computer & Knowledge Engineering (ICCKE); 1/ 1/2012, p516-522, 7p