Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Mohamed Aziz Doukkali"'
Publikováno v:
Sensors, Vol 24, Iss 7, p 2237 (2024)
This paper presents a high-gain low-noise amplifier (LNA) operating at the 5G mm-wave band. The full design combines two conventional cascode stages: common base (CB) and common emitter (CS). The design technique reduces the miller effect and uses lo
Externí odkaz:
https://doaj.org/article/c1f99ea1ef3547d9893a2ff9e9eb32cd
Publikováno v:
2016 Annual Reliability and Maintainability Symposium (RAMS)
2016 Annual Reliability and Maintainability Symposium (RAMS), Jan 2016, Tucson, United States. pp.7448024, ⟨10.1109/RAMS.2016.7448024⟩
2016 Annual Reliability and Maintainability Symposium (RAMS), 2016, Tucson, United States. pp.7448024, ⟨10.1109/RAMS.2016.7448024⟩
2016 Annual Reliability and Maintainability Symposium (RAMS), Jan 2016, Tucson, United States. pp.7448024, ⟨10.1109/RAMS.2016.7448024⟩
2016 Annual Reliability and Maintainability Symposium (RAMS), 2016, Tucson, United States. pp.7448024, ⟨10.1109/RAMS.2016.7448024⟩
International audience; Reliability simulation is an area of increasing interest as it allows the design of circuits that are both reliable and optimized for circuit performance by transient device degradation calculations. In this paper, Hot Carrier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::30ca46da6029982430555eb1fa73a0dd
https://normandie-univ.hal.science/hal-02184712
https://normandie-univ.hal.science/hal-02184712
Autor:
Philippe Descamps, Christophe Kelma, Olivier Tesson, Imene Lahbib, Mohamed Aziz Doukkali, Patrice Gamand
Publikováno v:
International Journal of Microwave and Wireless Technologies
International Journal of Microwave and Wireless Technologies, Cambridge University Press/European Microwave Association 2014, 6 (2), pp.195-200. ⟨10.1017/S1759078714000105⟩
International Journal of Microwave and Wireless Technologies, Cambridge University Press/European Microwave Association 2014, 6 (2), pp.195-200. ⟨10.1017/S1759078714000105⟩
International audience; This paper presents a circuit architecture for a new integrated on chip test method for microwave circuits. The proposed built-in-self-test (BIST) cell targets a direct low-cost measurement technique of the gain and the 1 dB i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::229215bbf78378ea4a5e75672789db20
https://hal.archives-ouvertes.fr/hal-02190952
https://hal.archives-ouvertes.fr/hal-02190952
Publikováno v:
2013 13th Mediterranean Microwave Symposium (MMS).
This paper presents a new microwave wideband controlled variable attenuator designed in a BiCMOS process. This variable attenuator is implanted as part of a microwave Built-In-Self-Test (BIST) circuit. The proposed BIST cell is dedicated for direct l
Publikováno v:
NEWCAS
This paper presents the design of an RF test signal generator for a Built-In-Self-Test (BIST) application. This embedded generator is the most sensitive part of a new BIST architecture which basically, consists of integrating an RF generator at the R