Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Mohamed Atef Shehata"'
Publikováno v:
IEEE Journal of Solid-State Circuits. 56:1745-1760
A rotary traveling-wave oscillator (RTWO) has an ability to generate multiple phases at millimeter-wave (mmW) frequencies while achieving low phase noise (PN). Unfortunately, due to the practically unavoidable transmission line (TL) dispersion, which
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bdbb7a4e5746beb9ce9905448e001c2b
https://doi.org/10.1109/jssc.2020.3044278
https://doi.org/10.1109/jssc.2020.3044278
Autor:
Mohamed Atef Shehata, Michael F. Keaveney, Vivek Roy, Hyman Shanan, Robert Bogdan Staszewski, James Breslin
Publikováno v:
IEEE Solid-State Circuits Letters. 4:72-75
In this letter, we propose a 32–42-GHz frequency quadrupler that performs digital logic operations between four phase-shifted differential signals at one-fourth of the output frequency. The four phase-shifted signals are generated via a 10-GHz rota
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8a69a20b79227c0de50590ac4a8a4fc
https://doi.org/10.1109/lssc.2021.3055628
https://doi.org/10.1109/lssc.2021.3055628
Publikováno v:
ESSCIRC
A rotary traveling-wave oscillator (RTWO) has an ability to generate multiple phases at millimeter-wave (mmW) frequencies while achieving low phase noise (PN). Unfortunately, due to transmission line (TL) dispersion, RTWOs suffer from flicker noise u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::09387243ec9e1e67474ad176f6fb0b4b
https://doi.org/10.1109/esscirc.2019.8902916
https://doi.org/10.1109/esscirc.2019.8902916
Autor:
Robert Bogdan Staszewski, Hyman Shanan, Mohamed Atef Shehata, Michael F. Keaveney, James Breslin, Vivek Roy
Publikováno v:
IEEE Solid-State Circuits Letters. 4:104-104
In the above article [1] , Fig. 1 was incorrectly provided. The correct figure and full caption appear here.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::098f107c53f7ec7c6f4002e21af135d3
https://doi.org/10.1109/lssc.2021.3070793
https://doi.org/10.1109/lssc.2021.3070793
Publikováno v:
IEEE Journal of Solid-State Circuits; Jun2021, Vol. 56 Issue 6, p1745-1760, 16p