Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Mohamed Alimam"'
Autor:
Woonggyu Lee, Seungjae Jung, Bonhyuck Koo, Jongwook Kye, Ahmed Saleh, Ahmed Gharieb, Mohamed Elrefaee, Mohamed Alimam
Publikováno v:
2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::419559a545df64a41fa9a9890b05d164
https://doi.org/10.1109/mdts54894.2022.9826947
https://doi.org/10.1109/mdts54894.2022.9826947
Publikováno v:
2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::45316c0f409862d64b540e34aceb4747
https://doi.org/10.1109/mdts54894.2022.9826957
https://doi.org/10.1109/mdts54894.2022.9826957
Publikováno v:
ICICDT
With continuous development in the IC advanced technologies, physical verification is becoming increasingly more complex in the semiconductor manufacturing process. Currently, different regression patterns-based techniques are widely adopted in the d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48f3745de780b77393a75351ff6396a8
https://doi.org/10.1109/icicdt.2018.8399764
https://doi.org/10.1109/icicdt.2018.8399764