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Autor:
Orłowska Karolina, Mognaschi Maria E., Kwoka Krzysztof, Piasecki Tomasz, Kunicki Piotr, Sierakowski Andrzej, Majstrzyk Wojciech, Podgórni Arkadiusz, Pruchnik Bartosz, di Barba Paolo, Gotszalk Teodor
Publikováno v:
Metrology and Measurement Systems, Vol 27, Iss 1, Pp 141-149 (2020)
Scanning electron microscopy (SEM) is a perfect technique for micro-/nano-object imaging [1] and movement measurement [2, 3] both in high and environmental vacuum conditions and at various temperatures ranging from elevated to low temperatures. In ou
Externí odkaz:
https://doaj.org/article/bbf422e593e44c8595700c477141834f
