Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Moch, Philippe"'
Autor:
Belmeguenai, Mohamed, Zighem, Fatih, Faurie, Damien, Chérif, Salim Mourad, Moch, Philippe, Westerholt, Kurt, Seiler, Wilfrid
Publikováno v:
physica status solidi (a), 209, 1328 (2012)
Co2MnSi (CMS) films of different thicknesses (20, 50 and 100 nm) were grown by radio frequency (RF) sputtering on a-plane sapphire substrates. Our X-rays diffraction study shows that, in all the samples, the cubic <110> CSM axis is normal to the subs
Externí odkaz:
http://arxiv.org/abs/1012.3837
Autor:
Zighem, Fatih, Roussigné, Yves, Chérif, Salim Mourad, Moch, Philippe, Youssef, Jamal Ben, Paumier, Fabien
Publikováno v:
J. Phys.: Condens. Matter 22 406001 (2010)
Microstrip ferromagnetic resonance and Brillouin scattering are used to provide a comparative determination of the magnetic parameters of thin permalloy layers interfaced with a non-magnetic (Al2O3) or with an antiferromagnetic oxide (NiO). It is sho
Externí odkaz:
http://arxiv.org/abs/1006.5598
Autor:
Belmeguenai, Mohamed, Zighem, Fatih, Chauveau, Thierry, Faurie, Damien, Roussigné, Yves, Chérif, Salim Mourad, Moch, Philippe, Westerholt, Kurt, Monod, Philippe
Publikováno v:
J.Appl.Phys.108:063926,2010
Magnetic properties of CoMnGe thin films of different thicknesses (13, 34, 55, 83, 100 and 200 nm), grown by RF sputtering at 400{\deg}C on single crystal sapphire substrates, were studied using vibrating sample magnetometry (VSM) and conventional or
Externí odkaz:
http://arxiv.org/abs/1005.4595
Publikováno v:
In Solid State Sciences 2010 12(3):298-301
Autor:
Jardin, Jean-Pierre, Moch, Philippe
Publikováno v:
Journal of Physics: Condensed Matter; 3/17/2004, Vol. 16 Issue 10, p1849-1870, 22p
Autor:
Jardin, Jean-Pierre, Moch, Philippe
Publikováno v:
Ferroelectrics; 2003, Vol. 288 Issue 1, p71, 8p
Publikováno v:
Ferroelectrics; Mar2000, Vol. 241 Issue 1, p141-148, 8p
Publikováno v:
Ferroelectrics; Feb2000, Vol. 239 Issue 1, p71-78, 8p
Publikováno v:
Ferroelectrics; Feb1994, Vol. 152 Issue 1, p379-384, 6p
Publikováno v:
Ferroelectrics; Feb1994, Vol. 152 Issue 1, p307-312, 6p