Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Miwa Kozu"'
Publikováno v:
Crystal Growth & Design. 15:4979-4985
The evolution of polytypism during GaAs nanowire growth was investigated by in situ X-ray diffraction. The growth of nanowires was found to start with the formation of zincblende structure, followed by the growth of wurtzite structure. The growth pro
High-speed three-dimensional reciprocal-space mapping during molecular beam epitaxy growth of InGaAs
Publikováno v:
Journal of Applied Crystallography. 45:1046-1053
This paper describes the development of a high-speed three-dimensional reciprocal-space mapping method designed for the real-time monitoring of the strain relaxation process during the growth of heterostructure semiconductors. Each three-dimensional
Autor:
Wolfgang Braun, André Proessdorf, Miwa Kozu, Masamitu Takahasi, S. Fujikawa, Wen Hu, M. Hanke, P. Rodenbach, H. Riechert, F. Grosse
Publikováno v:
Surface Science. 606:1458-1461
The InSb(111)A surface is prepared by molecular beam epitaxy and investigated by reflection high-energy electron diffraction (RHEED). The complete two dimensional diffraction pattern is mapped out by azimuthal RHEED (ARHEED). Two reconstructions are
Publikováno v:
Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials.
Autor:
Masamitu Takahasi, Kazuma Ikeda, Hidetoshi Suzuki, Miwa Kozu, Wen Hu, Yoshio Ohshita, Yuka Nakata
Publikováno v:
Journal of Crystal Growth. 378:34-36
The molecular-beam epitaxial growth processes of GaAs on Si(001) were investigated using in situ synchrotron X-ray diffraction. Three-dimensional X-ray intensity distributions around the Si and GaAs 022 Bragg points in reciprocal space were measured
Publikováno v:
Japanese Journal of Applied Physics. 55:04EJ04
The polytypism of GaAs nanowires was investigated by in situ X-ray diffraction under different growth conditions. The growth of nanowires was found to start with the formation of the zincblende structure, followed by the growth of the wurtzite struct
Publikováno v:
Extended Abstracts of the 2011 International Conference on Solid State Devices and Materials.
Publikováno v:
Journal of Physics: Conference Series. 425:202010
A ternary Fresnel zone plate (FZP) has been fabricated and installed at the beamline 11XU of SPring-8, in the aim of in situ studies on the growth of semiconductor nanostructures. The FZP is designed for an X-ray energy of 9.5 keV for the first-order
Autor:
Robert Feidenhans'l, Miwa Kozu, Wen Hu, Jesper Nygård, Peter Krogstrup, Masamitu Takahasi, Yuka Nakata, Morten Hannibal Madsen
Publikováno v:
Applied Physics Letters. 100:093103
In-situ monitoring of the crystal structure formation during Ga-assisted GaAs nanowire growth on Si(111) substrates has been performed in a combined molecular beam epitaxy growth and x-ray characterization experiment. Under Ga rich conditions, we sho
Publikováno v:
Japanese Journal of Applied Physics; Apr2016, Vol. 55 Issue 4s, p1-1, 1p