Zobrazeno 1 - 10
of 107
pro vyhledávání: '"Mistele, D."'
Autor:
Mistele, D *, Rotter, T, Röver, K.S, Paprotta, S, Seyboth, M, Schwegler, V, Fedler, F, Klausing, H, Semchinova, O.K, Stemmer, J, Aderhold, J, Graul, J
Publikováno v:
In Materials Science & Engineering B 2002 93(1):107-111
Autor:
Fedler, F. *, Hauenstein, R.J., Klausing, H., Mistele, D., Semchinova, O., Aderhold, J., Graul, J.
Publikováno v:
In Journal of Crystal Growth 2002 241(4):535-542
Autor:
Rotter, T. *, Ferretti, R., Mistele, D., Fedler, F., Klausing, H., Stemmer, J., Semchinova, O.K., Aderhold, J., Graul, J.
Publikováno v:
In Journal of Crystal Growth 2001 230(3):602-606
Autor:
Mistele, D. *, Fedler, F., Klausing, H., Rotter, T., Stemmer, J., Semchinova, O.K., Aderhold, J.
Publikováno v:
In Journal of Crystal Growth 2001 230(3):564-568
Autor:
Stemmer, J *, Fedler, F, Klausing, H, Mistele, D, Rotter, T, Semchinova, O, Aderhold, J, Sanchez, A.M, Pacheco, F.J, Molina, S.I, Fehrer, M, Hommel, D, Graul, J
Publikováno v:
In Journal of Crystal Growth 15 June 2000 216(1-4):15-20
Autor:
Emtsev, V.V, Davydov, V.Yu, Lundin, V.V, Poloskin, D.S, Aderhold, J, Klausing, H, Mistele, D, Rotter, T, Stemmer, J, Fedler, F, Semchinova, O *, Graul, J
Publikováno v:
In Journal of Crystal Growth 2000 210(1):273-277
Publikováno v:
In Materials Science & Engineering B 1999 59(1):350-354
Electron-beam-pumped nitride vertical-cavity surface- emitting structures with AlGaN/AlN DBR mirrors
Autor:
Klausing, H., Fedler, F., Danhardt, J., Jaurich, R., Kariazine, A., Gunster, S., Mistele, D., Graul, J.
Vertical cavity surface emitting structures designed for electron beam (EB) pumping have been grown by plasma assisted molecular beam epitaxy (PA-MBE). For the first time, AlGaN/AlN DBRs in conjunction with dielectric SiO2/HfO2 reflectors are utilize
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::39d9a53ea59564dd93d94be2f0ceca51
https://publica.fraunhofer.de/handle/publica/201223
https://publica.fraunhofer.de/handle/publica/201223
Publikováno v:
2014 IEEE 28th Convention of Electrical & Electronics Engineers in Israel (IEEEI); 2014, p1-5, 5p
Publikováno v:
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004; 2004, p1035-1038, 4p