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pro vyhledávání: '"Misner, Colin"'
Autor:
Allain, Pierre Etienne, Schwab, Lucien, Misner, Colin, Gely, Marc, Mairiaux, Estelle, Hermouet, Maxime, Walter, Benjamin, Leo, Giuseppe, Hentz, Sébastien, Faucher, Marc, Jourdan, Guillaume, Legrand, Bernard, Favero, Ivan
Atomic force spectroscopy and microscopy (AFM) are invaluable tools to characterize nanostructures and biological systems. Most experiments, including state-of-the-art images of molecular bonds, are achieved by driving probes at their mechanical reso
Externí odkaz:
http://arxiv.org/abs/1810.06209
Publikováno v:
2013 IEEE Seventh International Symposium on Service-Oriented System Engineering; 2013, p503-508, 6p
