Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Miru Noh"'
Autor:
Junghyun Park, Jin Kuk Yang, Sungkyun Park, Y.S. Lee, Bong Ko, Young Jun Chang, Jin-Seok Chung, Hyuk Kim, Jiwoong Kim, Miru Noh
Publikováno v:
Current Applied Physics. 16:1576-1580
By using the spectroscopic ellipsometric technique, we investigated the excimer laser annealing (ELA) effect on the electronic properties of indium tin oxides (ITO) films fabricated by the DC-sputtering method, which is the one of the most commonly k
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a0b7a83f763cfc4c6ffc172c9351c96
https://doi.org/10.1016/j.cap.2016.09.010
https://doi.org/10.1016/j.cap.2016.09.010
Autor:
Miru Noh, Young Jun Chang, Yongseok Lee, Min Gyu Kang, Jin-Seok Chung, Hyuk Kim, Jung-Hun Park, Il Wan Seo, Junghyun Park, Chong Yun Kang
Publikováno v:
Current Applied Physics. 16:145-149
We report on the effect of the excimer laser annealing on the electronic properties of indium tin oxide (ITO) sol–gel films by using spectroscopic ellipsometric technique. We found that the excimer laser annealing effectively induces the crystalliz
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2af1817d6b4d854dd1988440c57fdfca
https://doi.org/10.1016/j.cap.2015.11.007
https://doi.org/10.1016/j.cap.2015.11.007
Publikováno v:
Journal of Nanoscience and Nanotechnology. 15:8267-8270
We performed an optical study on the electronic properties of perovskite zirconate AZrO3 (A = Ca and Ba) nanocrystals (NCs), which depend strongly on the size of A ion as well as the postannealing process. The zirconate NCs were synthesized in the co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f11fa96f8fa0f8159aee90d76e4bc588
https://doi.org/10.1166/jnn.2015.11283
https://doi.org/10.1166/jnn.2015.11283
Autor:
Y.S. Lee, J-H. Park, Il Wan Seo, Jung-Hun Park, Hyuk Kim, J-S. Chung, Young Jun Chang, Miru Noh
Publikováno v:
Journal of the Korean Physical Society. 67:563-567
We investigated the change in the electronic properties of indium-tin-oxide sol-gel thin films for various annealing temperatures (T anneal ) up to 800 °C. The X-ray diffraction (XRD) measurement showed that the crystallinity was enhanced continuous
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8102e7c90aafc755a8bbd3319d920fc3
https://doi.org/10.3938/jkps.67.563
https://doi.org/10.3938/jkps.67.563
Publikováno v:
New Physics: Sae Mulli. 63:939-944
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f2b8e7428ec49974008495880d398081
https://doi.org/10.3938/npsm.63.939
https://doi.org/10.3938/npsm.63.939