Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Mirko Bernardoni"'
Publikováno v:
2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ddfd4ded0b78016823a66f7fec8c7a64
https://doi.org/10.1109/wipdaeurope55971.2022.9936535
https://doi.org/10.1109/wipdaeurope55971.2022.9936535
Publikováno v:
IEEE Transactions on Power Electronics. 34:4703-4710
An innovative modeling methodology for the simulation of electrothermal interaction in power devices, based on neural networks (NNs), is shown. The suitability of NNs in modeling the complicated nonlinear, temperature dependent characteristic that po
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f33cdac65328d15f8189a8e01bd24f49
https://doi.org/10.1109/tpel.2018.2863186
https://doi.org/10.1109/tpel.2018.2863186
Publikováno v:
e & i Elektrotechnik und Informationstechnik
OTP (One Time Programmable) memory in power technology enables electrical performance optimization together with area occupation reduction. In this paper, the aspects relative to the oxide breakdown (which is the key mechanism for memory programmabil
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fedc4a9c02cf22256a0a451b912cbf3f
Publikováno v:
Microelectronics Reliability. :389-392
Due to the intrinsic piezoelectric nature of Gallium Nitride (GaN), devices manufactured with such technology are in principle prone to experience electro-mechanically induced resonance phenomena under operating conditions. In this paper, we present
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::faa6d83ab9177499187c5510ccecdaad
https://doi.org/10.1016/j.microrel.2018.07.042
https://doi.org/10.1016/j.microrel.2018.07.042
Publikováno v:
Microelectronics Reliability. 80:223-229
In this work, a general methodology to extract compact, non-linear transient thermal models of complex thermal systems is presented and validated. The focus of the work is to show a robust method to develop compact and accurate non-linear thermal mod
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4d644fc09e387ec9a71b89682c1f853d
https://doi.org/10.1016/j.microrel.2017.12.005
https://doi.org/10.1016/j.microrel.2017.12.005
Autor:
Marco Simonazzi, Nicola Delmonte, Roberto Menozzi, Paolo Cova, Danilo Santoro, Mirko Bernardoni
Publikováno v:
Microelectronics Reliability. 126:114324
In this work we present a system-simulation approach to model the behavior of PROFET™ devices for automotive applications. Attention has been paid to the simulation speed, given the necessity to simulate long mission profiles in a short amount of t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c218c4c3dc62ca2a64e40caec4f8e821
https://doi.org/10.1016/j.microrel.2021.114324
https://doi.org/10.1016/j.microrel.2021.114324
Publikováno v:
IEEE Transactions on Power Electronics. 32:561-570
We present a finite-element analysis of the coupled electro-thermal behavior of a mm $^2$ -sized power DMOS device, with a focus on resolving µm-sized structures. For a reliable power technology, the predictions of current and temperature distributi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::84c4182cb09e5114b8716386ad97d1c7
https://doi.org/10.1109/tpel.2016.2527690
https://doi.org/10.1109/tpel.2016.2527690
Publikováno v:
Microelectronics Reliability. 58:126-132
In this paper, a simple method to describe the effect of Printed Circuit Board (PCB) and environment on the thermal behavior of packaged devices is addressed. This approach aims at exploiting the benefit of compact thermal models, which are necessari
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b638a5755b3be677b86233490c522d6d
https://doi.org/10.1016/j.microrel.2015.11.029
https://doi.org/10.1016/j.microrel.2015.11.029
Autor:
Marianne Mataln, Mirko Bernardoni, Florian Peter Pribahsnik, Michael Nelhiebel, Andreas Lindemann
Publikováno v:
IEEE Transactions on Power Electronics. :1-1
Due to the intrinsic piezoelectric nature of gallium nitride (GaN), devices manufactured with such technology are in principle prone to experience electromechanically induced resonance phenomena during cyclic switching operation. We will outline an a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::160a5af9e7a75412abe5850e34baaf65
https://doi.org/10.1109/tpel.2020.2977752
https://doi.org/10.1109/tpel.2020.2977752
Publikováno v:
The Review of scientific instruments. 88(2)
The curvature evolution of a thin film layer stack containing a top Al layer is measured during temperature cycles with very high heating rates. The temperature cycles are generated by means of programmable electrical power pulses applied to miniatur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a9aeda219da623fac87b0df345fac29b
https://pubmed.ncbi.nlm.nih.gov/28249534
https://pubmed.ncbi.nlm.nih.gov/28249534