Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Mircea Vlăduţiu"'
Publikováno v:
Applied System Innovation, Vol 7, Iss 4, p 67 (2024)
This study presents a numerical method for evaluating the maintainability of a dual-axis solar tracking system that can be deployed in residential areas for improved energy production. The purpose of this research manuscript is threefold. It targets
Externí odkaz:
https://doaj.org/article/118c814098ef4780b1f2c2d29a6dadcf
Publikováno v:
Energies, Vol 14, Iss 7, p 2009 (2021)
This paper presents an improved mathematical model for calculating the solar test factor (STF) and solar reliability factor (SRF) of a photovoltaic (PV) automated equipment. By employing a unified metrics system and a combined testing suite encompass
Externí odkaz:
https://doaj.org/article/eaab04b2f8ea41f7921ffdeed4bf1034
Publikováno v:
Energies, Vol 14, Iss 9, p 2541 (2021)
This paper presents a modified global energy production computation formula that replaces the traditional Performance Ratio (PR) with a novel Solar Reliability Factor (SRF) for mobile solar tracking systems. The SRF parameter describes the reliabilit
Externí odkaz:
https://doaj.org/article/5baad2158b894815b16c6e32cd9dfb91
Publikováno v:
Energies, Vol 14, Iss 4, p 1074 (2021)
This paper presents a mathematical approach for determining the reliability of solar tracking systems based on three fault coverage-aware metrics which use system error data from hardware, software as well as in-circuit testing (ICT) techniques, to c
Externí odkaz:
https://doaj.org/article/7d29667645ad4c38ba7b01b2d65e9031
Publikováno v:
Simulation Modelling Practice and Theory. 23:60-70
In quantum computation the importance of fault tolerance is paramount, due to the low reliability of the quantum circuit components. Therefore, several fault tolerance assessing tools and methodologies have been developed; most of them are analytic,
Publikováno v:
Microelectronics Reliability. 50:304-311
This paper presents a VHDL-based simulated fault injection (SFI) methodology for quantum circuits. The main objective is to attain a high error modeling capability at a technology independent level. For this purpose, gate level simulation models for
Publikováno v:
Journal of Electronic Testing. 20:61-78
Greedy scheduling algorithms are proposed here to improve the test concurrency under power limits. An extended tree growing technique is used to model the power-constrained test scheduling problem in these algorithms. A constant additive model is emp
Autor:
Mircea Vlăduţiu
The subject of this book is the analysis and design of digital devices that implement computer arithmetic. The book's presentation of high-level detail, descriptions, formalisms and design principles means that it can support many research activities
Autor:
Mircea Vlăduţiu
Publikováno v:
Computer Arithmetic ISBN: 9783642183140
The chapter is dedicated to the functional analysis and synthesis of the floating point arithmetic devices and it begins by highlighting the characteristics of operating in floating point, with investigation of the fundamental operations of addition,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::50234fca7d89aa55e9dfd0f1e3592343
https://doi.org/10.1007/978-3-642-18315-7_5
https://doi.org/10.1007/978-3-642-18315-7_5
Autor:
Mircea Vlăduţiu
Publikováno v:
Computer Arithmetic ISBN: 9783642183140
Similarly to the chapter dedicated to the multiplication operation, this chapter begins with the presentation of the fundamental methods for binary division. In the same unitary manner used throughout the entire book, the synthesis of a sequential de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7dfb286f4c88ebe9d54b76b1f7dfd6d0
https://doi.org/10.1007/978-3-642-18315-7_4
https://doi.org/10.1007/978-3-642-18315-7_4