Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Minxu Peng"'
Autor:
Agarwal, Akshay, Kasaei, Leila, Xinglin He, Kitichotkul, Ruangrawee, Hitit, Oğuz Kağan, Minxu Peng, Schultz, J. Albert, Feldman, Leonard C., Goyal, Vivek K.
Publikováno v:
Proceedings of the National Academy of Sciences of the United States of America; 7/30/2024, Vol. 121 Issue 31, p1-8, 26p
Publikováno v:
Microscopy and Microanalysis. 28:36-39
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::375ab2647f4156bd392572eb0bde610d
https://doi.org/10.1017/s1431927622001064
https://doi.org/10.1017/s1431927622001064
Publikováno v:
IEEE Transactions on Computational Imaging. 8:521-535
In conventional particle beam microscopy, knowledge of the beam current is essential for accurate micrograph formation and sample milling. This generally necessitates offline calibration of the instrument. In this work, we establish that beam current
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ceafb10b94442b080a2f470a4571a24b
https://doi.org/10.1109/tci.2022.3182212
https://doi.org/10.1109/tci.2022.3182212
Autor:
Luisa Watkins, Minxu Peng, Sheila W. Seidel, Vivek K Goyal, Akshay Agarwal, Christopher C. Yu
Publikováno v:
Microscopy and Microanalysis. 27:422-425
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e1ea2ab66cced4c0d1e4f53358ed74bb
https://doi.org/10.1017/s1431927621002026
https://doi.org/10.1017/s1431927621002026
Publikováno v:
IEEE Transactions on Computational Imaging. 7:547-561
In a focused ion beam (FIB) microscope, source particles interact with a small volume of a sample to generate secondary electrons that are detected, pixel by pixel, to produce a micrograph. Randomness of the number of incident particles causes excess
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a3659f6774ae6a937aa8b1a3fd637cde
https://doi.org/10.1109/tci.2021.3076887
https://doi.org/10.1109/tci.2021.3076887
Autor:
Prakash Ishwar, Mertcan Cokbas, Minxu Peng, Brian Kulis, Unay Dorken Gallastegi, Janusz Konrad, Vivek K Goyal
Publikováno v:
MLSP
Most research on deep learning algorithms for image denoising has focused on signal-independent additive noise. Focused ion beam (FIB) microscopy with direct secondary electron detection has an unusual Neyman Type A (compound Poisson) measurement mod
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3522063d859e4aa8f470f0d2db6562ee
https://doi.org/10.1109/mlsp52302.2021.9596272
https://doi.org/10.1109/mlsp52302.2021.9596272
Autor:
Vivek K Goyal, Sheila W. Seidel, Akshay Agarwal, Luisa Watkins, Minxu Peng, Christopher C. Yu
Publikováno v:
2021 IEEE International Conference on Image Processing (ICIP).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c86ecef4de50532e8a3a48b2ca73bf18
https://doi.org/10.1109/icip42928.2021.9506340
https://doi.org/10.1109/icip42928.2021.9506340
Publikováno v:
arXiv
© 2020 Elsevier B.V. Focused ion beam microscopy suffers from source shot noise – random variation in the number of incident ions in any fixed dwell time – along with random variation in the number of detected secondary electrons per incident io
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::464ded265b759be231b6380240cfc7ac
http://arxiv.org/abs/1906.03285
http://arxiv.org/abs/1906.03285
