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pro vyhledávání: '"Minu E Mathew"'
Autor:
Minu E Mathew, Anumol K
Publikováno v:
IOSR journal of VLSI and Signal Processing. 2:21-26
Fast development of memory devices cause more area occupation of memory in a chip and the strong market competition have increased the standards of the produced memories. The increased demand on reliability has, in turn, stressed the importance of fa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91b6b7c2fc9ca046a0876c1fa5c2ada1
https://doi.org/10.9790/4200-0212126
https://doi.org/10.9790/4200-0212126
