Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Mingkun Yao"'
Publikováno v:
Open Geosciences. 14:354-366
The effect of topographic correction (TOC) has a profound influence on the quantitative application of remote sensing image. With regard to the invalid evaluation of the TOC model with such a single topographic correction assessment (TCA) method, we
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9a392c7f894b66c1f1f60bbdac729a6e
https://doi.org/10.1515/geo-2022-0359
https://doi.org/10.1515/geo-2022-0359
Publikováno v:
Sustainability; Volume 14; Issue 11; Pages: 6813
Carbon emissions and consequent climate change directly affect the sustainable development of ecological environment systems and human society, which is a pertinent issue of concern for all countries globally. The construction of a carbon emission in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4f68a2a1a7d07c726440dddaa802bf86
With the increasing penetration of distributed generation (DG), the risk of voltage violations in active distribution networks (ADNs) has become a major concern for the system operator. Soft open point (SOP) is a flexible power electronic device whic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e56cbe1e04495dc23781b6a773219923
https://orca.cardiff.ac.uk/id/eprint/123976/1/1-s2.0-S1876610219304308-main.pdf
https://orca.cardiff.ac.uk/id/eprint/123976/1/1-s2.0-S1876610219304308-main.pdf
Publikováno v:
Electronics
Volume 9
Issue 2
Electronics, Vol 9, Iss 2, p 295 (2020)
Volume 9
Issue 2
Electronics, Vol 9, Iss 2, p 295 (2020)
With the increasing penetration of distributed generators, various operational problems, especially severe voltage violation, threaten the secure operation of active distribution networks. To effectively cope with the voltage fluctuations, novel cont
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f65ed14c0055b0cbe37752a4390e763c
https://doi.org/10.3390/electronics9020295
https://doi.org/10.3390/electronics9020295