Zobrazeno 1 - 10
of 49
pro vyhledávání: '"Miner, J.F."'
Autor:
Pardo, Flavio, Cirelli, R.A., Ferry, E.J., Lai, W.Y.-C., Klemens, F.P., Miner, J.F., Pai, C.S., Bower, J.E., Mansfield, W.M., Kornblit, A., Sorsch, T.W., Taylor, J.A., Baker, M.R., Fullowan, R., Simon, M.E., Aksyuk, V.A., Ryf, R., Dyson, H., Arney, S.
Publikováno v:
In Microelectronic Engineering 2007 84(5):1157-1161
Autor:
Chang, C.-P., Vuang, H.-H., Baker, M.R., Pai, C.S., Klemens, F.P., Miner, J.F., Mansfield, W.M., Kleiman, R.N., Kornbllit, A., Baumann, F.H., Rogers, S.N., Bude, M., Grazul, J.L., Lloyd, E.J., Frei, M., Sorsch, T.W., Cirelli, R., Ferry, E., Bolan, K., Barr, D.
Publikováno v:
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138); 2000, p53-56, 4p
Autor:
Lu, Q., Cheung, K.P., Ciampa, N.A., Liu, C.T., Chang, C.-P., Colonell, J.I., Lai, W.-Y.-C., Liu, R., Miner, J.F., Vaidya, H., Pai, C.-S., Clemens, J.T.
Publikováno v:
1999 IEEE International Reliability Physics Symposium Proceedings 37th Annual (Cat No99CH36296); 1999, p396-399, 4p
Autor:
Cheung, K.P., Liu, C.T., Chang, C.-P., Colonell, J.I., Lai, W.Y.-C., Liu, R., Miner, J.F., Pai, C.S., Vaidya, H., Clemens, J.T., Hasegawa, E.
Publikováno v:
1999 IEEE International Reliability Physics Symposium Proceedings 37th Annual (Cat No99CH36296); 1999, p52-56, 5p
Autor:
Cheung, K.P., Lu, Q., Ciampa, N.A., Liu, C.T., Chang, C.-P., Colonell, J.I., Lai, W.-Y.-C., Liu, R., Miner, J.F., Vaidya, H., Pai, C.-S., Clemens, J.T.
Publikováno v:
1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat No99TH8395); 1999, p137-140, 4p
Autor:
Chang, C.P., Pai, C.S., Baumann, F.H., Liu, C.T., Rafferty, C.S., Pinto, M.R., Lloyd, E.J., Bude, M., Klemens, F.P., Miner, J.F., Cheung, K.P., Colonell, J.I., Lai, W.Y.C., Vaidya, H., Hillenius, S.J., Liu, R.C., Clemens, J.T.
Publikováno v:
International Electron Devices Meeting IEDM Technical Digest; 1997, p661-664, 4p
Autor:
Liu, C.T., Ma, Y., Oh, M., Diodato, P.W., Stiles, K.R., Mcmacken, J.R., Li, F., Chang, C.P., Cheung, K.P., Colonell, J.I., Lai, W.Y.C., Liu, R., Lloyd, E.J., Miner, J.F., Pai, C.S., Vaidya, H., Frackoviak, J., Timko, A., Klemens, F., Maynard, H.
Publikováno v:
International Electron Devices Meeting 1998 Technical Digest (Cat No98CH36217); 1998, p589-592, 4p
Autor:
Ruichen Liu, Cheng-Yih Lin, Harris, E., Merchant, S., Downey, S.W., Weber, G., Ciampa, N.A., Wai Tai, Lai, W.Y.C., Morris, M.D., Bower, J.E., Miner, J.F., Frackoviak, J., Mansfield, W., Barr, D., Keller, R., Chong-Ping Chang, Chien-Shing Pai, Rogers, S.N., Gregor, R.
Publikováno v:
Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407); 2000, p111-113, 3p
Publikováno v:
1991 Proceedings Eighth International IEEE VLSI Multilevel Interconnection Conference; 1991, p442-444, 3p
Autor:
Pardo, F., Simon, M.E., Aksyuk, V.A., Ryf, R., Lai, W.Y.-C., Pai, C.S., Klemens, F.P., Miner, J.F., Cirelli, R.A., Ferry, E.J., Bower, J.E., Mansfield, W.M., Kornblit, A., Sorsch, T.W., Taylor, J.A., Baker, M.R., Fullowan, R., Dyson, H., Gasparyan, A., Low, Y.
Publikováno v:
IEEE/LEOS International Conference on Optical MEMS & Their Applications Conference, 2006; 2006, p21-22, 2p