Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Milne, R. H."'
Publikováno v:
Scanning Microscopy
An ultra-high vacuum scanning electron microscope (UHV-SEM) has been used to study sub-monolayers of Cs on Si(100) surface. Cs adsorption on the surface causes a considerable change in the work function. Coverages below 1/2 monolayer (ML) have been e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1459::6659b90b73cab092273f3e156ced147b
https://digitalcommons.usu.edu/context/microscopy/article/1920/viewcontent/WDCcenterscan1993AzimHarlandMartin_CaesiumSi100Studied.pdf
https://digitalcommons.usu.edu/context/microscopy/article/1920/viewcontent/WDCcenterscan1993AzimHarlandMartin_CaesiumSi100Studied.pdf
Publikováno v:
Journal of Microscopy; 1993, Vol. 170 Issue 3, p193-199, 7p
Autor:
Milne, R. H., Fan, T. W.
Publikováno v:
Journal of Microscopy; 1987, Vol. 147 Issue 1, p75-81, 7p
Autor:
Howie, A., Milne, R. H.
Publikováno v:
Journal of Microscopy; 1984, Vol. 136 Issue 2, p279-285, 7p
Autor:
Milne, R. H., Howie, A.
Publikováno v:
Philosophical Magazine A; November 1984, Vol. 49 Issue: 5 p665-682, 18p
Publikováno v:
Philosophical Magazine B; March 1987, Vol. 55 Issue: 3 p341-358, 18p
Autor:
Milne, R. H., Fabian, D. J.
Publikováno v:
Applied Physics A: Materials Science & Processing; December 1991, Vol. 53 Issue: 6 p574-577, 4p
Publikováno v:
Applied Physics A: Materials Science & Processing; March 1991, Vol. 52 Issue: 3 p197-202, 6p