Zobrazeno 1 - 10
of 86
pro vyhledávání: '"Milić M. Pejović"'
Autor:
Milić M. Pejović
Publikováno v:
IEEE Transactions on Dielectrics and Electrical Insulation. 30:812-816
Autor:
Milić M. Pejović, Svetlana M. Pejović
Publikováno v:
Applied Radiation and Isotopes. 196:110730
Publikováno v:
Facta universitatis - series: Electronics and Energetics. 34:307-322
The results of the reliability testing of Littelfuse and EPCOS gas-filled surge arresters for different overvoltages under DC discharge will be presented in this paper. The static breakdown voltage of these gas components was estimated using voltage
Autor:
Milić M. Pejović
Publikováno v:
Radiation Effects and Defects in Solids. 174:567-578
The investigations presented here study the creation as well as passivation/neutralization of positive trapped charge in the oxide (fixed traps) and traps near and at the Si–SiO2 interface ...
Publikováno v:
International Journal of Electrical Power & Energy Systems. 104:436-442
The aim of this paper is to determine how the shape, number, position and dimensions of the conductive particles produced during switching operations influence the dielectric strength of the gas-filled switches insulated under pressure which are in t
Autor:
Milić M. Pejović
Publikováno v:
Vacuum. 201:111116
Publikováno v:
Applied Radiation and Isotopes. 184:110207
This paper presents a detailed statistical analysis of experimental results of dynamic breakdown voltage and electrical breakdown time delay for xenon-filled diode. These quantities have a stochastic nature and they were measured in the cases when th
Publikováno v:
Radiation Protection Dosimetry
This paper presents experimental results of dynamic breakdown voltage and delay response as functions of gamma ray air kerma rate for xenon-filled tube at 2.7 mbar pressure. Gamma ray air kerma rate range was considered from 123 nGy h–1 up to 12.3
Publikováno v:
International Journal of Photoenergy, Vol 2020 (2020)
Publikováno v:
Plasma Chemistry and Plasma Processing. 38:415-428
In order to analyze the processes induced by electrical breakdown and discharge responsible for memory effect in krypton-filled tube at low pressure, experimental data mean value of electrical breakdown time delay $$\bar{t}_{d}$$ as a function of aft