Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Milena Hugenschmidt"'
Publikováno v:
Physical Review Research, Vol 2, Iss 4, p 043313 (2020)
Scanning transmission electron microscopy (STEM) and scanning electron microscopy (SEM) are prominent techniques for the structural characterization of materials. STEM in particular provides high spatial resolution down to the sub-ångström range. T
Externí odkaz:
https://doaj.org/article/f1ba7c020bba4a20a550c10f862eedd2
Publikováno v:
Microscopy and Microanalysis. 29:219-234
Contamination is an undesired side effect in many electron microscopy studies that covers structures of interest and degrades resolution. Although contamination has been studied for decades, open questions remain regarding favorable imaging condition
Autor:
Erich Müller, Milena Hugenschmidt, Heike Störmer, Lukas Grünewald, Susanne Fritsch-Decker, Carsten Weiss, Dagmar Gerthsen
Publikováno v:
Microscopy and Microanalysis. 28:938-940
Publikováno v:
Microscopy and Microanalysis. 27:1586-1589
Publikováno v:
Microscopy and Microanalysis. 27:2022-2024
Autor:
Olivia, Wenzel, Viktor, Rein, Milena, Hugenschmidt, Frank, Schilling, Claus, Feldmann, Dagmar, Gerthsen
Publikováno v:
RSC advances. 11(45)
Nanocrystalline tungsten nitride (WN
Publikováno v:
Journal of Microscopy. 274:150-157
Scanning transmission electron microscopy (STEM) at low primary electron energies has received increasing attention in recent years because knock-on damage can be avoided and high contrast for weakly scattering materials is obtained. However, the bro
Autor:
Milena Hugenschmidt, Ksenia Kutonova, Sarah Moulai, Elvia P. Valadez Sánchez, Hartmut Gliemann, Stefan Bräse, Dagmar Gerthsen, Christof Wöll
Publikováno v:
AgBioForum, 37 (11), Art.-Nr.: 2000209
The first example of layer‐by‐layer growth of a metal–organic framework (MOF) directly on transmission electron microscopy (TEM) grids is described. ZIF‐8 is deposited on thin amorphous carbon films and subjected to a structure analysis by (s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f1f544d5fd1dc0402df43e6543f1a924
Publikováno v:
Ultramicroscopy. 207
For quantitative electron microscopy the comparison of measured and simulated data is essential. Monte Carlo (MC) simulations are well established to calculate the high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) i
The broadening of the electron beam in the sample has to be considered when performing scanning transmission electron microscopy (STEM) at low primary electron energies. This work presents direct measurements of the beam broadening in a range of mate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4903cfb0e73c745bc76305db39c59f06