Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Milad Omrani"'
Publikováno v:
حکمت و فلسفه, Vol 20, Iss 77, Pp 85-112 (2024)
According to Marx's interpretation, in the Democritean system, atoms move in a vacuum according to a blind necessity. Applying the word "accidental" to the Democritus system does not imply the unpredictable or causeless movement of atoms; rather, it
Externí odkaz:
https://doaj.org/article/eec3111164454a3594c548fd79cb82c1
Autor:
milad omrani, Fereshteh Nabati
Publikováno v:
حکمت و فلسفه, Vol 14, Iss 54, Pp 122-148 (2018)
To Avicenna, the relation between the subject and the predicate is of three kinds: possibility, necessity, and impossibility. Impossibility is the same as necessary non-existence. The word ‘modal’ in modal logic refers to these three. Avicenna ha
Externí odkaz:
https://doaj.org/article/749fc5c96217407391f4a024dd6d0791
Publikováno v:
Pattern Recognition. ICPR International Workshops and Challenges ISBN: 9783030687861
ICPR Workshops (7)
ICPR Workshops (7)
Processing historical documents is a complicated task in computer vision due to the presence of degradation, which decreases the performance of Machine Learning models. Recently, Deep Learning (DL) models have achieved state-of-the-art accomplishment
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95ea23afde005ad1a64a3bb15c8e5ab2
https://doi.org/10.1007/978-3-030-68787-8_21
https://doi.org/10.1007/978-3-030-68787-8_21
Autor:
Mohamed Cheriet, Milad Omrani Tamrin
Publikováno v:
Pattern Recognition. ICPR International Workshops and Challenges ISBN: 9783030687861
ICPR Workshops (7)
ICPR Workshops (7)
Document Information Retrieval has attracted researchers’ attention when discovering secrets behind ancient manuscripts. To understand such documents, analyzing their layouts and segmenting their relevant features are fundamental tasks. Recent effo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a147bfed5bb5b246808e062bdc7d4e15
https://doi.org/10.1007/978-3-030-68787-8_20
https://doi.org/10.1007/978-3-030-68787-8_20
Autor:
Saad Chidami, J.-J. Brault, Jean-Francois Dubois, Milad Omrani Tamrin, Sebastien Henwood, Samuel-Jean Bassetto
Publikováno v:
NEWCAS
Today, in semiconductor manufacturing, wafer failures are frequent problems with the production lines. To increase the production yield, images are the most important pieces of data used to detect defect-free wafers. However, there are many tools tha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0815a84a7a26ba3a9b10d34e4eea643e
https://doi.org/10.1109/newcas44328.2019.8961246
https://doi.org/10.1109/newcas44328.2019.8961246