Zobrazeno 1 - 2
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pro vyhledávání: '"Milad F. Tabet"'
Autor:
Milad F. Tabet, William A. McGahan
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 17:1836-1839
Artificial neural networks and the Levenberg–Marquardt algorithm are combined to calculate the thickness and refractive index of transparent thin films from spectroscopic reflectometry data. A neural network is a set of simple, highly interconnecte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ef7bbfd8a390f46bdda3f567f12d4c0
https://doi.org/10.1116/1.581900
https://doi.org/10.1116/1.581900
The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented
