Zobrazeno 1 - 10
of 83
pro vyhledávání: '"Miklós Tegze"'
Autor:
Gábor Bortel, Miklós Tegze, Marcin Sikorski, Richard Bean, Johan Bielecki, Chan Kim, Jayanath C. P. Koliyadu, Faisal H. M. Koua, Marco Ramilli, Adam Round, Tokushi Sato, Dmitrii Zabelskii, Gyula Faigel
Publikováno v:
Nature Communications, Vol 15, Iss 1, Pp 1-7 (2024)
Abstract X-ray Free Electron Lasers (XFEL) are cutting-edge pulsed x-ray sources, whose extraordinary pulse parameters promise to unlock unique applications. Several new methods have been developed at XFELs; however, no methods are known, which allow
Externí odkaz:
https://doaj.org/article/b10571628e4544a9a761b66688f7dcc3
Autor:
Marcin Sikorski, Marco Ramilli, Raphael de Wijn, Viktoria Hinger, Aldo Mozzanica, Bernd Schmitt, Huijong Han, Richard Bean, Johan Bielecki, Gábor Bortel, Thomas Dietze, Gyula Faigel, Konstantin Kharitonov, Chan Kim, Jayanath C. P. Koliyadu, Faisal H. M. Koua, Romain Letrun, Luis M. Lopez, Nadja Reimers, Adam Round, Abhisakh Sarma, Tokushi Sato, Miklós Tegze, Monica Turcato
Publikováno v:
Frontiers in Physics, Vol 11 (2023)
The JUNGFRAU detector is a well-established hybrid pixel detector developed at the Paul Scherrer Institut (PSI) designed for free-electron laser (FEL) applications. JUNGFRAU features a charge-integrating dynamic gain switching architecture, with thre
Externí odkaz:
https://doaj.org/article/ebe1563c26334aa8a2f5413cc0c49050
Autor:
Miklós Tegze, Gábor Bortel
Publikováno v:
IUCrJ, Vol 8, Iss 6, Pp 980-991 (2021)
In single-particle imaging (SPI) experiments, diffraction patterns of identical particles are recorded. The particles are injected into the X-ray free-electron laser (XFEL) beam in random orientations. The crucial step of the data processing of SPI i
Externí odkaz:
https://doaj.org/article/d2c530f6ac414536942e43ae94e50c1d
Publikováno v:
Journal of Applied Crystallography. 54:123-131
Indexing of Kikuchi and Kossel lines is a crucial step in K-line pattern analysis. Previous approaches mostly rely on the knowledge of unit-cell parameters and experimental geometry. An auto-indexing procedure is introduced that is able to find the u
Publikováno v:
Journal of Synchrotron Radiation. 26:170-174
Atomic resolution X-ray holography can be realized by using the atoms of the sample as inside sources or inside detectors. However, until now there were only very few experiments in which the atoms played the role of inside sources. The reason is two
Autor:
Gábor Bortel, Miklós Tegze
Publikováno v:
IUCrJ
IUCrJ, Vol 8, Iss 6, Pp 980-991 (2021)
IUCrJ, Vol 8, Iss 6, Pp 980-991 (2021)
Two orientation methods are compared: the expansion maximization compression (EMC) algorithm and the correlation maximization (CM) algorithm. To investigate the efficiency, reliability and accuracy of the methods at various X-ray free-electron-laser
Publikováno v:
Journal of Synchrotron Radiation. 23:214-218
Kossel line patterns contain information on the crystalline structure, such as the magnitude and the phase of Bragg reflections. For technical reasons, most of these patterns are obtained using electron beam excitation, which leads to surface sensiti
Autor:
Miklós Tegze, G. Bortel
Publikováno v:
Acta crystallographica. Section A, Foundations and advances. 74(Pt 5)
In coherent-diffraction-imaging experiments X-ray diffraction patterns of identical particles are recorded. The particles are injected into the X-ray free-electron laser (XFEL) beam in random orientations. If the particle has symmetry, finding the or
Publikováno v:
Physical Review A. 94
We computationally study the resolution limits for three-dimensional coherent x-ray diffractive imaging of heavy, nonbiological systems using Ar clusters as a prototype. We treat electronic and nuclear dynamics on an equal footing and remove the froz
Autor:
Miklós Tegze, G. Bortel
Publikováno v:
Acta crystallographica. Section A, Foundations and advances. 72(Pt 4)
The short pulses of X-ray free-electron lasers can produce diffraction patterns with structural information before radiation damage destroys the particle. From the recorded diffraction patterns the structure of particles or molecules can be determine