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pro vyhledávání: '"Mike Rathore"'
Autor:
Jeffrey S. Kauppila, Bharat L. Bhuva, Jingchen Cao, Joseph V. D'Amico, Dennis R. Ball, Mike Rathore, Shi-Jie Wen, Balaji Narasimham, L. Xu, Lloyd W. Massengill, R. Fung
Publikováno v:
IEEE Transactions on Nuclear Science. 68:823-829
In this work, single-event upset (SEU) responses of D flip-flop (FF) designs with different threshold-voltage options in a 7-nm bulk FinFET technology are examined. Experimental data imply that single-event (SE) cross section depends heavily on suppl