Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Mike Rathore"'
Autor:
Jeffrey S. Kauppila, Bharat L. Bhuva, Jingchen Cao, Joseph V. D'Amico, Dennis R. Ball, Mike Rathore, Shi-Jie Wen, Balaji Narasimham, L. Xu, Lloyd W. Massengill, R. Fung
Publikováno v:
IEEE Transactions on Nuclear Science. 68:823-829
In this work, single-event upset (SEU) responses of D flip-flop (FF) designs with different threshold-voltage options in a 7-nm bulk FinFET technology are examined. Experimental data imply that single-event (SE) cross section depends heavily on suppl
Autor:
D'Amico, Joseph V., Ball, Dennis R., Cao, Jingchen, Xu, Lyuan, Rathore, Mike, Wen, Shi-Jie, Fung, Rita, Narasimham, Balaji, Kauppila, Jeffrey S., Massengill, Lloyd W., Bhuva, Bharat L.
Publikováno v:
IEEE Transactions on Nuclear Science; May2021, Vol. 68 Issue 5, p823-829, 7p