Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Mike Pak"'
Publikováno v:
2014 International Conference on Microelectronic Test Structures (ICMTS).
Contact Chain is a well known element of the diagnostic set of test structures used across many generations of silicon processes. Implementation of such test structures becomes challenging in new technologies with 3D devices, like FinFET. Contacts to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8fdca04c21099257044bab3491077e4
https://doi.org/10.1109/icmts.2014.6841469
https://doi.org/10.1109/icmts.2014.6841469
Publikováno v:
Thin Solid Films. 321:201-205
Si devices with two double δ-doped (one p-δ and one n-δ) junctions were grown by silicon molecular beam epitaxy (MBE). A new I–V bistability phenomenon was observed in those devices. We used a `band switching' mechanism to explain the bistabilit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::20ac7196500c7aec9cf6785af6ff98e9
https://doi.org/10.1016/s0040-6090(98)00473-8
https://doi.org/10.1016/s0040-6090(98)00473-8
Conference
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.