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pro vyhledávání: '"Mike Mello"'
Autor:
Paul Zimmerman, Rajen Dias, Mike Mello, Lars D. Skoglund, George F. Raiser, Vasudeva Atluri, Robert Hernandez, Vijay Gupta
Publikováno v:
International Symposium for Testing and Failure Analysis.
A laser spallation technique to measure the tensile strength of thin film interfaces is introduced. In this technique, a laser-generated stress wave of nanosecond duration in the substrate spalls off (completely removes) a coating deposited on the su
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a70f470c69402e66ace0baaa7c5d5368
https://doi.org/10.31399/asm.cp.istfa2000p0025
https://doi.org/10.31399/asm.cp.istfa2000p0025
Infrared diffraction interferometer for coplanarity measurement of high-density solder bump pattern.
Autor:
Mike Mello
Publikováno v:
Optical Engineering; Apr2004, Vol. 43 Issue 4, p888-894, 7p