Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Mike Leary"'
Publikováno v:
CICC
AMS design in remaining CMOS nodes is tedious & about managing technology-imposed non-idealities. AMS area scaling 0.8-0.9x per node vs. 0.5x for logic & SRAM. Parasitics a LDEs only get worse, will ultimately limit scaling. Digital-friendly AMS desi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::34bde73f397bff88e60171b2b17a892f
https://doi.org/10.1109/cicc.2019.8780267
https://doi.org/10.1109/cicc.2019.8780267
Autor:
Mario M. Pelella, JR Zhou, David Eppes, Mike Leary, Stephen Hale, Date Noorlag, Larry Bullard, Peter Huebler, Stefan Schuler, Andreas Dreizner, Jim Working, Darin Chan, Christoph Schwan, Manfred Horstmann, Bill En, Karsten Wieczorek, David Greenlaw, Thomas Heidel, Volker Heinig, John Miethke, Nick Kepler, Stephan Kruegel, Kai Frohberg, Jason Rivers, Thomas Heller, Ralf Richter, Norma Rodriguez, Rich Klein
Publikováno v:
2007 IEEE International SOI Conference.
A new device structure to mitigate plasma charging damage in advanced SOI technologies has been demonstrated that can be easily incorporated into modern-day, as well as future-scaled microprocessor designs. This novel structure offers improved produc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b03dfb978a7a34245474febbdb674f5
https://doi.org/10.1109/soi.2007.4357860
https://doi.org/10.1109/soi.2007.4357860
Autor:
Mike Leary
Publikováno v:
Planning Outlook. 31:7-12
The possible role of computer‐based expert systems in town and country planning has yet to be formalised and many planners are not aware of the potential and limitations of software developments in this area. This paper defines expert systems for p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::305d70b07d216e17435adfec8e64bba2
https://doi.org/10.1080/00320718808711811
https://doi.org/10.1080/00320718808711811
Conference
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