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pro vyhledávání: '"Mihir K. Ravel"'
Autor:
Cary I Sneider, Mihir K Ravel
Publikováno v:
Journal of Pre-College Engineering Education Research (J-PEER)
The 21st century has seen a growing movement in the United States towards the adoption of engineering and technology as a complement to science education. Motivated by this shift, this article offers insights into engineering education for grades P-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bbb4e88f610e30ceeda5d08a45398165
https://docs.lib.purdue.edu/context/jpeer/article/1277/viewcontent/jpe1277.pdf
https://docs.lib.purdue.edu/context/jpeer/article/1277/viewcontent/jpe1277.pdf
Publikováno v:
Review of Scientific Instruments. 64:3132-3138
The time‐of‐flight technique is well suited for the analysis of electrons photoemitted from a surface by a pulsed laser. In this paper, a novel design for a time‐of‐flight charged particle analyzer is presented which incorporates a charge‐c
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 41:467-475
Deconvolution of measurement system effects from pulse response measurements is demonstrated to yield reproducible, accurate characterization of the impulse response (and vector frequency response) of a photodetector or photoreceiver, as well as the
Publikováno v:
SPIE Proceedings.
End-to-end quality of service for real-time video delivery over ATM networks depends on both video coding and network performance. Historical measures of QoS for data services have involved packet delivery parameters such as cell loss and delay, but
Publikováno v:
Human Vision and Electronic Imaging
Many models of image quality have been developed to predict the visibility of differences between pairs of still images. Various methods have been suggested for combining predictions generated for individual frames of a video sequence. To explore thi
Autor:
Alice L. Reinheimer, Mihir K. Ravel
Publikováno v:
SPIE Proceedings.
This paper presents preliminary results on the performance of n-channel, backside-thinned charge-coupled devices (CCDs) as electron-bombarded-semiconductor (EBS) imagers for the detection of 1-10 keV electrons. The devices exhibit average EBS gains r
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